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Transmission Electron Microscopy and Diffractometry of Materials

  • Brent Fultz
  • James M. Howe

Table of contents

  1. Front Matter
    Pages I-XXI
  2. Brent Fultz, James M. Howe
    Pages 1-61
  3. Brent Fultz, James M. Howe
    Pages 63-121
  4. Brent Fultz, James M. Howe
    Pages 123-166
  5. Brent Fultz, James M. Howe
    Pages 167-224
  6. Brent Fultz, James M. Howe
    Pages 225-274
  7. Brent Fultz, James M. Howe
    Pages 275-338
  8. Brent Fultz, James M. Howe
    Pages 339-422
  9. Brent Fultz, James M. Howe
    Pages 423-464
  10. Brent Fultz, James M. Howe
    Pages 465-520
  11. Brent Fultz, James M. Howe
    Pages 521-596
  12. Brent Fultz, James M. Howe
    Pages 597-661
  13. Back Matter
    Pages 663-748

About this book

Introduction

This textbook develops the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms, wave interference, and the formation and analysis of diffraction patterns. It explains the uniqueness of each technique, especially imaging and spectroscopy in the TEM. Simple citations of rules are avoided as much as possible, and both practical and theoretical issues are explained in detail. The book can be used as both an introductory and advanced-level graduate text since sections/chapters are sorted according to difficulty and grouped for use in quarter and semester courses on TEM and XRD. Numerous problems are provided at the end of each chapter to reinforce key concepts, and solutions are available to instructors. Appendices provide procedures for introductory laboratory exercises, and up-to-date tabulations of physical data useful for TEM and XRD.

Keywords

Helium-Atom-Streuung Powder diffraction X-Ray crystal crystallography diffraction electron diffraction electron microscopy imaging materials characterization microscopy spectroscopy transmission electron microscopy

Authors and affiliations

  • Brent Fultz
    • 1
  • James M. Howe
    • 2
  1. 1.Division of Engineering and Applied ScienceCalifornia Institute of TechnologyPasadenaUSA
  2. 2.Department of Materials Science and EngineeringUniversity of VirginiaCharlottesvilleUSA

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-662-04901-3
  • Copyright Information Springer-Verlag Berlin Heidelberg 2002
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-662-04903-7
  • Online ISBN 978-3-662-04901-3
  • Buy this book on publisher's site