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Scanning Tunneling Microscopy III

Theory of STM and Related Scanning Probe Methods

  • Roland Wiesendanger
  • Hans-Joachim Güntherodt

Part of the Springer Series in Surface Sciences book series (SSSUR, volume 29)

Table of contents

  1. Front Matter
    Pages I-XV
  2. R. Wiesendanger, H.-J. Güntherodt
    Pages 1-5
  3. M. Tsukada, K. Kobayashi, N. Isshiki, S. Watanabe, H. Kageshima, T. Schimizu
    Pages 77-103
  4. C. R. Leavens, G. C. Aers
    Pages 105-140
  5. S. Ciraci
    Pages 179-206
  6. U. Landman, W. D. Luedtke
    Pages 207-249
  7. D. Tománek
    Pages 269-292
  8. U. Hartmann
    Pages 293-360
  9. Back Matter
    Pages 361-375

About this book

Introduction

While the first two volumes on Scanning Tunneling Microscopy (STM) and its related scanning probe (SXM) methods have mainly concentrated on intro­ ducing the experimental techniques, as well as their various applications in different research fields, this third volume is exclusively devoted to the theory of STM and related SXM methods. As the experimental techniques including the reproducibility of the experimental results have advanced, more and more theorists have become attracted to focus on issues related to STM and SXM. The increasing effort in the development of theoretical concepts for STM/SXM has led to considerable improvements in understanding the contrast mechanism as well as the experimental conditions necessary to obtain reliable data. Therefore, this third volume on STM/SXM is not written by theorists for theorists, but rather for every scientist who is not satisfied by just obtaining real­ space images of surface structures by STM/SXM. After a brief introduction (Chap. 1), N. D. Lang first concentrates on theoretical concepts developed for understanding the STM image contrast for single-atom adsorbates on metals (Chap. 2). A scattering-theoretical approach to the STM is described by G. Doyen (Chap. 3). In Chap. 4, C. NClguera concentrates on the spectroscopic information obtained by STM, whereas the role of the tip atomic and electronic structure in STM/STS is examined more closely by M. Tsukada et al. in Chap. 5.

Keywords

Nanotechnologie Nanotechnology Oberflächenphysik Rastersensormikroskopie Rastertunnelmikroskopie Scanning probe microscopy Sensor Surface science Technologie Tunnelling theory Tunneltheorie physics science surface surface physics

Editors and affiliations

  • Roland Wiesendanger
    • 1
  • Hans-Joachim Güntherodt
    • 2
  1. 1.Institute of Applied PhysicsUniversity of HamburgHamburgGermany
  2. 2.Department of PhysicsUniversity of BaselBaselSwitzerland

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-642-97470-0
  • Copyright Information Springer-Verlag Berlin Heidelberg 1993
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-642-97472-4
  • Online ISBN 978-3-642-97470-0
  • Series Print ISSN 0931-5195
  • Buy this book on publisher's site