Nonlinear Dynamics and Pattern Formation in Semiconductors and Devices

Proceedings of a Symposium Organized Along with the International Conference on Nonlinear Dynamics and Pattern Formation in the Natural Environment Noordwijkerhout, The Netherlands, July 4–7, 1994

  • Franz-Josef Niedernostheide
Conference proceedings

Part of the Springer Proceedings in Physics book series (SPPHY, volume 79)

About these proceedings


Nonlinear Dynamics and Pattern Formation in Semiconductors and Devices is concerned with fundamental processes of self-organization and electrical instabilities to show the correlations between them. Leading experts give a survey of recent experimental observations concerning the spatiotemporal behaviour of dissipative structures in various semiconductor and present theoretical approches to problems of self-organization and the basic concepts of dynamical structures. To connect the field of semiconductor physics with the theory of nonequilibrium dissipative systems, the emphasis lies on the study of localized structures, their stability and bifurcation behaviour. A point of special interest is the evolution of dynamic structures and the investigation of more complex structures arising from interactions between these structures. Beyond that, possible applications of nonlinear effects and self-organization phenomena with respect to signal processing, sensors, and neural networks are discussed.


dynamics environment iron nonlinear dynamics organization processing self-organization semiconductor semiconductor device semiconductors signal signal processing structure structures superlattice

Editors and affiliations

  • Franz-Josef Niedernostheide
    • 1
  1. 1.Institut für Angewandte PhysikMünsterGermany

Bibliographic information

  • DOI
  • Copyright Information Springer-Verlag Berlin Heidelberg 1995
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-642-79508-4
  • Online ISBN 978-3-642-79506-0
  • Series Print ISSN 0930-8989
  • Series Online ISSN 1867-4941
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