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Physics of Highly Excited Atoms and Ions

  • Vladimir S. Lebedev
  • Israel L. Beigman

Part of the Springer Series on Atoms+Plasmas book series (SSAOPP, volume 22)

Table of contents

  1. Front Matter
    Pages I-X
  2. Vladimir S. Lebedev, Israel L. Beigman
    Pages 1-9
  3. Vladimir S. Lebedev, Israel L. Beigman
    Pages 11-37
  4. Vladimir S. Lebedev, Israel L. Beigman
    Pages 39-57
  5. Vladimir S. Lebedev, Israel L. Beigman
    Pages 59-92
  6. Vladimir S. Lebedev, Israel L. Beigman
    Pages 93-131
  7. Vladimir S. Lebedev, Israel L. Beigman
    Pages 183-212
  8. Vladimir S. Lebedev, Israel L. Beigman
    Pages 251-281
  9. Back Matter
    Pages 283-299

About this book

Introduction

The status of research in the Physics of Highly Excited Atoms and Ions is covered in this monograph. It includes today's approaches and methods for describing isolated Rydberg atoms and ions, radiative transitions between highly excited states, and photoionization and photorecombination processes. The authors present a number of efficient methods for the calculations in the theory of collisions of highly excited atoms and ions with neutral and charged particles and of spectral-line broadening of Rydberg atomic series in gases, low- and high-temperature plasmas, and astrophysics. Particular attention is paid to a comparison of the theoretical results with available experimental data.

Keywords

Broadening Collisions Cross section Plasma Radiation Rydberg atoms and ions astrophysics collision elastic scattering excited atoms molecule particles quenching scattering spectra

Authors and affiliations

  • Vladimir S. Lebedev
    • 1
  • Israel L. Beigman
    • 1
  1. 1.Optical Division, P. N. Lebedev Physical Inst.Russian Academy of SciencesMoscowRussia

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-642-72175-5
  • Copyright Information Springer-Verlag Berlin Heidelberg 1998
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-642-72177-9
  • Online ISBN 978-3-642-72175-5
  • Series Print ISSN 1615-5653
  • Buy this book on publisher's site