In-situ Materials Characterization

Across Spatial and Temporal Scales

  • Alexander Ziegler
  • Heinz Graafsma
  • Xiao Feng Zhang
  • Joost W.M. Frenken

Part of the Springer Series in Materials Science book series (SSMATERIALS, volume 193)

Table of contents

  1. Front Matter
    Pages i-xi
  2. Xiao Feng Zhang
    Pages 59-109
  3. Götz Eckold, Helmut Schober
    Pages 147-179
  4. Joost W. M. Frenken
    Pages 181-206
  5. Alexander Ziegler, Heinz Graafsma
    Pages 207-250
  6. Back Matter
    Pages 251-256

About this book

Introduction

The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly, or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes, and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical, and x-ray microscopies (e.g., scanning, transmission, and low-energy electron microscopy, and scanning probe microscopy), or in the scattering realm with x-ray, neutron and electron diffraction.

Keywords

In-situ characterization Material dynamics Nanoanalysis Nanoscale materials Neutron scattering Photoelectron spectroscopy Scanning probe techniques Structure-property Ultra-fast analysis X-ray absorption spectroscopy

Editors and affiliations

  • Alexander Ziegler
    • 1
  • Heinz Graafsma
    • 2
  • Xiao Feng Zhang
    • 3
  • Joost W.M. Frenken
    • 4
  1. 1.Microscopy & Microanalysis UnitThe University of the WitwatersrandJohannesburgGermany
  2. 2.Photon-Science Detector GroupDeutsches Elektronen SynchrotronHamburgGermany
  3. 3.Nanotechnology Systems DivisionHitachi High Technologies America, Inc.PleasantonUSA
  4. 4.Leiden University Kamerlingh Onnes LaboratoryLeidenThe Netherlands

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-642-45152-2
  • Copyright Information Springer-Verlag Berlin Heidelberg 2014
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Physics and Astronomy
  • Print ISBN 978-3-642-45151-5
  • Online ISBN 978-3-642-45152-2
  • Series Print ISSN 0933-033X
  • Series Online ISSN 2196-2812
  • About this book