Frontiers in Optical Methods

Nano-Characterization and Coherent Control

Editors:

ISBN: 978-3-642-40593-8 (Print) 978-3-642-40594-5 (Online)

Table of contents (12 chapters)

  1. Front Matter

    Pages i-xii

  2. No Access

    Chapter

    Pages 1-25

    Introduction: Ultra-Fast Response of Ultra-Thin Materials on Solid Surfaces

  3. Reflectance Spectroscopy

    1. Front Matter

      Pages 27-27

    2. No Access

      Chapter

      Pages 29-44

      Real-Time Analysis of Initial Oxidation Process on Si(001) by Means of Surface Differential Reflectance Spectroscopy and Reflectance Difference Spectroscopy

    3. No Access

      Chapter

      Pages 45-62

      Development of In-Vacuum Microscope Under High Pressure and Its Applications

    4. No Access

      Chapter

      Pages 63-81

      Infrared and Terahertz Synchrotron Radiation: Optics and Applications

  4. Ultrafast and Coherent Measurement

    1. Front Matter

      Pages 83-83

    2. No Access

      Chapter

      Pages 85-103

      Time-Resolved X-Ray Diffraction Studies of Coherent Lattice Dynamics Using Synchrotron Radiation

    3. No Access

      Chapter

      Pages 105-127

      Coherent Phonon Dynamics in Carbon Nanotubes

    4. No Access

      Chapter

      Pages 129-151

      Generation and Observation of GHz–THz Acoustic Waves in Thin Films and Microstructures Using Optical Methods

    5. No Access

      Chapter

      Pages 153-166

      Sate-of-the-Art of Terahertz Science and Technology

    6. No Access

      Chapter

      Pages 167-184

      Broadband Terahertz Spectroscopy of Thin Films

  5. THz-Technology

    1. Front Matter

      Pages 185-185

    2. No Access

      Chapter

      Pages 187-196

      Terahertz Light Source Based on Synchrotron Radiation

    3. No Access

      Chapter

      Pages 197-212

      Single-Photon Counting and Passive Microscopy of Terahertz Radiation

    4. No Access

      Chapter

      Pages 213-224

      Material Evaluation with Optical Measurement Systems: Focusing on Terahertz Spectroscopy

  6. Back Matter

    Pages 225-228