Frontiers in Optical Methods

Nano-Characterization and Coherent Control

  • Ken-ichi Shudo
  • Ikufumui Katayama
  • Shin-Ya Ohno

Part of the Springer Series in Optical Sciences book series (SSOS, volume 180)

Table of contents

  1. Front Matter
    Pages i-xii
  2. Reflectance Spectroscopy

  3. Ultrafast and Coherent Measurement

    1. Front Matter
      Pages 83-83
    2. Keiko Kato, Katsuya Oguri, Masahiro Kitajima
      Pages 105-127
    3. Masayoshi Tonouchi
      Pages 153-166
    4. Ikufumui Katayama, Masaaki Ashida
      Pages 167-184
  4. THz-Technology

  5. Back Matter
    Pages 225-228

About this book


This collection of reviews by leading Japanese researchers covers topics like ultrafast optical responses, terahertz and phonon studies, super-sensitive surface and high-pressure spectroscopy, combination of visible and x-ray photonics. Several related areas at the cutting edge of measurement technology and materials science are included. This book is partly based on well-cited review articles in the Japanese language in special volumes of the Journal of the Vacuum Society of Japan.


Laser laser THz spectroscopy X-ray technicques extreme methods in optical measurements microstructures phonon techniques surface differential reflectance spectroscopy synchrotron radiation ultrafast spectroscopy wave propagation in thin films and

Editors and affiliations

  • Ken-ichi Shudo
    • 1
  • Ikufumui Katayama
    • 2
  • Shin-Ya Ohno
    • 3
  1. 1.Yokohama National UniversityYokohama National UniversityYokohamaJapan
  2. 2.Faculty of EngeneeringYokohama National UniversityYokohamaJapan
  3. 3.Faculty of EngeneeringYokohama National UniversityYokohamaJapan

Bibliographic information