Classical Trajectory Perspective of Atomic Ionization in Strong Laser Fields

Semiclassical Modeling

  • Jie Liu

Part of the SpringerBriefs in Physics book series (SpringerBriefs in Physics)

About this book

Introduction

The ionization of atoms and molecules in strong laser fields is an active field in modern physics and has versatile applications in such as attosecond physics, X-ray generation, inertial confined fusion (ICF), medical science and so on. Classical Trajectory Perspective of Atomic Ionization in Strong Laser Fields covers the basic concepts in this field and discusses many interesting topics using the semiclassical model of classical trajectory ensemble simulation, which is one of the most successful ionization models and has the advantages of a clear picture, feasible computing and accounting for many exquisite experiments quantitatively. The book also presents many applications of the model in such topics as the single ionization, double ionization, neutral atom acceleration and other timely issues in strong field physics, and delivers useful messages to readers with presenting the classical trajectory perspective on the strong field atomic ionization.
The book is intended for graduate students and researchers in the field of laser physics, atom molecule physics and theoretical physics.
Dr. Jie Liu is a professor of Institute of Applied Physics and Computational Mathematics, China and Peking University.

Keywords

Atom and Molecule CTMC Approach CTMC+T Approach Double Ionization Intense Laser Fields Rescattering Single Ionization Strong-field Tunneling Ionization Tunneling Ionization Theory

Authors and affiliations

  • Jie Liu
    • 1
  1. 1.Institute of applied physics and computational mathematicsBeijingChina, People's Republic

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-642-40549-5
  • Copyright Information The Author(s) 2014
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Physics and Astronomy
  • Print ISBN 978-3-642-40548-8
  • Online ISBN 978-3-642-40549-5
  • Series Print ISSN 2191-5423
  • Series Online ISSN 2191-5431
  • About this book