Ellipsometry of Functional Organic Surfaces and Films

  • Karsten Hinrichs
  • Klaus-Jochen Eichhorn

Part of the Springer Series in Surface Sciences book series (SSSUR, volume 52)

Table of contents

  1. Front Matter
    Pages I-XXI
  2. Christoph Cobet
    Pages 1-26
  3. Biomolecules at Surfaces

    1. Front Matter
      Pages 27-27
    2. Simona D. Pop, Karsten Hinrichs, Sylvia Wenmackers, Christoph Cobet, Norbert Esser, Dietrich R. T. Zahn
      Pages 47-59
  4. Smart Polymer Surfaces and Films

    1. Front Matter
      Pages 61-61
    2. Michael Erber, Martin Tress, Klaus-Jochen Eichhorn
      Pages 63-78
    3. Eva Bittrich, Petra Uhlmann, Klaus-Jochen Eichhorn, Karsten Hinrichs, Dennis Aulich, Andreas Furchner
      Pages 79-105
  5. Nanostructured Surfaces and Organic/Inorganic Hybrids

    1. Front Matter
      Pages 107-107
    2. Thomas W. H. Oates
      Pages 109-133
    3. Kenneth Järrendahl, Hans Arwin
      Pages 155-169
  6. Thin Films of Organic Semiconductors for OPV, OLEDs and OTFT

    1. Front Matter
      Pages 171-171
    2. Stergios Logothetidis
      Pages 173-195
    3. Ovidiu D. Gordan, Dietrich R. T. Zahn
      Pages 197-219
  7. Developments in Ellipsometric Real-Time/In-situ Monitoring Techniques

    1. Front Matter
      Pages 221-221
    2. Ralf P. Richter, Keith B. Rodenhausen, Nico B. Eisele, Mathias Schubert
      Pages 223-248
    3. Jörg Rappich, Karsten Hinrichs, Guoguang Sun, Xin Zhang
      Pages 287-302
  8. Infrared Spectroscopic Methods for Characterization of Thin Organic Films

    1. Front Matter
      Pages 303-303
    2. Katy Roodenko, Damien Aureau, Florent Yang, Peter Thissen, Jörg Rappich
      Pages 305-324
  9. Optical Constants

    1. Front Matter
      Pages 337-337
    2. Andreas Furchner, Dennis Aulich
      Pages 339-345
    3. Andreas Furchner, Dennis Aulich
      Pages 347-356
  10. Back Matter
    Pages 357-363

About this book


Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.


Biomolecules at Surfaces Characterization of Organic Semiconductors for OPV, Ellipsometric Real-time/In-situ Monitoring Techniques Functional and Smart Films Infrared Brillant Light Sources for Micro-ellipsometric Studies Nanostructured Surfaces OLEDs and OTFT Optical Constants Optical Constants of Organic Layers Organic and Hybrid Materials Smart Polymer Surfaces and Films

Editors and affiliations

  • Karsten Hinrichs
    • 1
  • Klaus-Jochen Eichhorn
    • 2
  1. 1.Leibniz Institute for Analytical Sciences - ISAS - e. V.BerlinGermany
  2. 2.Leibniz Institute of Polymer Research AnalyticsDresdenGermany

Bibliographic information