Ellipsometry at the Nanoscale

  • Maria Losurdo
  • Kurt Hingerl

Table of contents

  1. Front Matter
    Pages i-xxiv
  2. Enric Garcia-Caurel, Razvigor Ossikovski, Martin Foldyna, Angelo Pierangelo, Bernard Drévillon, Antonello De Martino
    Pages 31-143
  3. Angel Yanguas-Gil, Herbert Wormeester
    Pages 179-202
  4. David E. Aspnes
    Pages 203-224
  5. Herbert Wormeester, Thomas W. H. Oates
    Pages 225-256
  6. Michael Bergmair, Kurt Hingerl, Peter Zeppenfeld
    Pages 257-311
  7. Yasuhiro Mizutani, Yukitoshi Otani
    Pages 313-323
  8. Maria Losurdo, April S. Brown, Giovanni Bruno
    Pages 453-491
  9. Alain C. Diebold, Florence J. Nelson, Vimal K. Kamineni
    Pages 557-581
  10. Peter Petrik, Miklos Fried
    Pages 583-606
  11. Denis Cattelan, Céline Eypert, Marzouk Kloul, Mélanie Gaillet, Jean-Paul Gaston, Roland Seitz et al.
    Pages 629-667

About this book

Introduction

This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications.

Keywords

Correlation measurements Kerr Spectroscopy Plasmonics theory Polarimetry Polarized light

Editors and affiliations

  • Maria Losurdo
    • 1
  • Kurt Hingerl
    • 2
  1. 1.CNR Bari, Ist. Metodologie InorganicheUniversità BariBariItaly
  2. 2.Zentrum für Oberflächen- und, Nanoanalytik (ZONA)Universität LinzLinzAustria

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-642-33956-1
  • Copyright Information Springer-Verlag Berlin Heidelberg 2013
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Engineering
  • Print ISBN 978-3-642-33955-4
  • Online ISBN 978-3-642-33956-1
  • About this book