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Atomic Scale Interconnection Machines

Proceedings of the 1st AtMol European Workshop Singapore 28th-29th June 2011

  • Christian Joachim
Conference proceedings

Part of the Advances in Atom and Single Molecule Machines book series (AASMM)

Table of contents

  1. Front Matter
    Pages i-ix
    PDF
  2. High Precision Local Electrical Probing: Potential and Limitations for the Analysis of Nanocontacts and Nanointerconnects
    B. Guenther, M. Maier, J. Koeble, A. Bettac, F. Matthes, C. M. Schneider et al.
    Pages 1-8
  3. Ultra-Compact Multitip Scanning Probe Microscope with an Outer Diameter of 50 mm
    Vasily Cherepanov, Evgeny Zubkov, Hubertus Junker, Stefan Korte, Marcus Blab, Peter Coenen et al.
    Pages 9-21
  4. Atomic Scale Interconnection Machine
    O. A. Neucheva, R. Thamankar, T. L. Yap, C. Troadec, J. Deng, C. Joachim
    Pages 23-33
  5. The DUF Project: A UHV Factory for Multi-Interconnection of a Molecule Logic Gates on Insulating Substrate
    D. Martrou, L. Guiraud, R. Laloo, B. Pecassou, P. Abeilhou, O. Guillermet et al.
    Pages 35-52
  6. Challenges and Advances in Instrumentation of UHV LT Multi-Probe SPM System
    Zhouhang Wang
    Pages 53-79
  7. On the Road to Multi-Probe Non-Contact AFM
    T. Vančura, S. Schmitt, V. Friedli, S. Torbrügge, O. Schaff
    Pages 81-87
  8. Atomically Precise Manufacturing: The Opportunity, Challenges, and Impact
    John N. Randall, James R. Von Ehr, Joshua Ballard, James Owen, Rahul Saini, Ehud Fuchs et al.
    Pages 89-106
  9. Combined STM and Four-Probe Resistivity Measurements on Single Semiconductor Nanowires
    M. Berthe, C. Durand, T. Xu, J. P. Nys, P. Caroff, B. Grandidier
    Pages 107-118
  10. Probing Electronic Transport of Individual Nanostructures with Atomic Precision
    Shengyong Qin, An-Ping Li
    Pages 119-130
  11. Surface Conductance Measurements on a MoS2 Surface Using a UHV-Nanoprobe System
    R. Thamankar, O. A. Neucheva, T. L. Yap, C. Joachim
    Pages 131-140
  12. Multi-Probe Characterization of 1D and 2D Nanostructures Assembled on Ge(001) Surface by Gold Atom Deposition and Annealing
    M. Wojtaszek, M. Kolmer, S. Godlewski, J. Budzioch, B. Such, F. Krok et al.
    Pages 141-152
  13. Nanometer-Scale Four-Point Probe Resistance Measurements of Individual Nanowires by Four-Tip STM
    S. Hasegawa, T. Hirahara, Y. Kitaoka, S. Yoshimoto, T. Tono, T. Ohba
    Pages 153-165
  14. Silicon Surface Conductance Investigated Using a Multiple-Probe Scanning Tunneling Microscope
    Janik Zikovsky, Mark H. Salomons, Stanislav A. Dogel, Robert A. Wolkow
    Pages 167-179
  15. Atomic-Scale Devices in Silicon by Scanning Tunneling Microscopy
    J. A. Miwa, M. Y. Simmons
    Pages 181-196
  16. Electronic Transport on the Nanoscale
    C. A. Bobisch, A. M. Bernhart, M. R. Kaspers, M. C. Cottin, J. Schaffert, R. Möller
    Pages 197-214
  17. Solid State Nano Gears Manipulations
    Cedric Troadec, Jie Deng, Francisco Ample, Ramesh Thamankar, Christian Joachim
    Pages 215-223
  18. Probing Single Molecular Motors on Solid Surface
    Haiming Guo, Yeliang Wang, Min Feng, Li Gao, Hongjun Gao
    Pages 225-244

About these proceedings

Introduction

This volume documents the first International Workshop on Atomic Scale Interconnection Machines organised by the European Integrated Project AtMol in June 2011 in Singapore. The four sessions, discussed here in revised contributions by high level speakers, span topics such as: multi-probe UHV instrumentation, atomic scale nano-material nanowires characterization, atomic scale surface conductance measurements and surface atomic scale mechanical machineries. This state-of-the-art account allows academic researchers and industry engineers access to the tools they need to be at the forefront of the atomic scale technology revolution.

Keywords

AtMol Atom Technology LT-UHV STM Molecule logic gates Nano interconnections

Editors and affiliations

  • Christian Joachim
    • 1
  1. 1., GNSCNRSToulouse CedexFrance

Bibliographic information