Scanning Probe Microscopy in Nanoscience and Nanotechnology 3

  • Bharat Bhushan
Part of the NanoScience and Technology book series (NANO)

Table of contents

  1. Front Matter
    Pages i-xx
  2. Scanning Probe Microscopy Techniques

    1. Front Matter
      Pages 1-1
    2. Luohan Peng, Huiliang Zhang, Philip Hemmer, Hong Liang
      Pages 3-21
    3. Andres Castellanos-Gomez, Nicolás Agraït, Gabino Rubio-Bollinger
      Pages 23-53
  3. Characterization

    1. Front Matter
      Pages 77-77
    2. Ugo Valbusa, Vincenzo Ierardi
      Pages 79-98
    3. Etienne Dague, Audrey Beaussart, David Alsteens
      Pages 171-193
    4. Markus Hund, Clemens Liedel, Larisa Tsarkova, Alexander Böker
      Pages 195-233
    5. Tamara Elzein, Maurice Brogly, Sophie Bistac
      Pages 235-247
    6. Alessandra Luzia Da Róz, Carolina de Castro Bueno, Fabio Minoru Yamaji, Ana Lucia Brandl, Fabio de Lima Leite
      Pages 249-290
    7. Olivier Soppera, Ali Dirani, Safi Jradi, Vincent Roucoules, Hamidou Haidara
      Pages 291-315
    8. Frank W. DelRio, Martin L. Dunn, Maarten P. de Boer
      Pages 363-393
  4. Industrial Applications

    1. Front Matter
      Pages 395-395
    2. R. Colaço, P. A. Carvalho
      Pages 397-430
    3. Agnieszka Tomala, Hakan Göçerler, Ille C. Gebeshuber
      Pages 431-483

About this book

Introduction

This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

Keywords

High-speed AFM imaging SNOM atomic force microscopy biological nanocharacterization biomimetics overview of SPM applications scanning probe microscopy scanning tunneling microscopy spectroscopic techniques in SPM

Editors and affiliations

  • Bharat Bhushan
    • 1
  1. 1., Nanoprobe Laboratory for Bio- &Ohio State UniversityColumbusUSA

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-642-25414-7
  • Copyright Information Springer-Verlag Berlin Heidelberg 2013
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Chemistry and Materials Science
  • Print ISBN 978-3-642-25413-0
  • Online ISBN 978-3-642-25414-7
  • Series Print ISSN 1434-4904