Table of contents

  1. Front Matter
    Pages i-xviii
  2. Yonghua Rong
    Pages 1-35
  3. Yonghua Rong
    Pages 37-66
  4. Yonghua Rong
    Pages 67-170
  5. Yonghua Rong
    Pages 295-378
  6. Back Matter
    Pages 491-552

About this book

Introduction

"Characterization of Microstructures by Analytical Electron Microscopy (AEM)" describes the basic concepts and operative techniques of AEM. It focuses on the study of phase transformations and dislocation in deformation by AEM. Further, the book also presents the physical concepts and mathematic analysis for diffraction and crystallography using numerous examples, such as the quantitative prediction of the orientation relationships in phase transformations. The book is intended for researchers and graduate students in materials science and engineering, and condensed matter physics. Yonghua Rong is a professor at School of Materials Science and Engineering, Shanghai Jiao Tong University, China.

Keywords

AEM Analytical electron microscopy Electron diffraction HEP Imaging Martensite Steel TEM Transmission electron microscopy

Authors and affiliations

  • Yonghua┬áRong
    • 1
  1. 1.School of Materials Science and EngineeringShanghai Jiao Tong UniversityShanghaiP. R. China

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-642-20119-6
  • Copyright Information Higher Education Press, Beijing and Springer-Verlag Berlin Heidelberg 2012
  • Publisher Name Springer, Berlin, Heidelberg
  • Print ISBN 978-3-642-20118-9
  • Online ISBN 978-3-642-20119-6
  • About this book