Formal Methods for Industrial Critical Systems

15th International Workshop, FMICS 2010, Antwerp, Belgium, September 20-21, 2010. Proceedings

  • Stefan Kowalewski
  • Marco Roveri
Conference proceedings FMICS 2010

Part of the Lecture Notes in Computer Science book series (LNCS, volume 6371)

Table of contents

  1. Front Matter
  2. Alessio Ferrari, Daniele Grasso, Gianluca Magnani, Alessandro Fantechi, Matteo Tempestini
    Pages 1-16
  3. Michael Altenhofen, Achim D. Brucker
    Pages 17-32
  4. Jeremy W. Bryans, Wei Wei
    Pages 33-49
  5. Alexei Iliasov, Elena Troubitsyna, Linas Laibinis, Alexander Romanovsky, Kimmo Varpaaniemi, Dubravka Ilic et al.
    Pages 50-66
  6. Christian Kern, Javier Esparza
    Pages 67-81
  7. Jörg Brauer, Andy King, Stefan Kowalewski
    Pages 82-98
  8. Ahmed Shah Mashiyat, Fazle Rabbi, Hao Wang, Wendy MacCaull
    Pages 99-114
  9. Michael Gerke, Rüdiger Ehlers, Bernd Finkbeiner, Hans-Jörg Peter
    Pages 132-147
  10. Wilfried Steiner, Bruno Dutertre
    Pages 148-163
  11. Despo Galataki, Andrei Radulescu, Kees Verstoep, Wan Fokkink
    Pages 164-179
  12. Radu Mateescu, Wendelin Serwe
    Pages 180-197
  13. Jan Camenisch, Sebastian Mödersheim, Dieter Sommer
    Pages 198-214
  14. Lars Michael Kristensen, Michael Westergaard
    Pages 215-230
  15. Back Matter

About these proceedings

Keywords

BPMN CBMC Java automated translation business process modeling case study development formal methods formal specification formal verification petri net software software engineering verification

Editors and affiliations

  • Stefan Kowalewski
    • 1
  • Marco Roveri
    • 2
  1. 1.Embedded Software LaboratoryRWTH AachenAachenGermany
  2. 2.Fondazione Bruno Kessler — IRSTPovo (Trento)Italy

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-642-15898-8
  • Copyright Information Springer Berlin Heidelberg 2010
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Computer Science
  • Print ISBN 978-3-642-15897-1
  • Online ISBN 978-3-642-15898-8
  • Series Print ISSN 0302-9743
  • Series Online ISSN 1611-3349
  • About this book