Overview
- Detailed description of optical methods for defect recognition
- Integrates the basics of the methods and their applications
- Provides a reference for researchers and engineers
Part of the book series: Springer Series in Materials Science (SSMATERIALS, volume 123)
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Table of contents (9 chapters)
Keywords
About this book
Reviews
Authors and Affiliations
About the author
Born on February 26, 1954 in Kiev, Ukraine.
1971 – 1976 Study at the State University of Woronezh, Russia. Graduation: Qualified physicist with award.
1977 – 1992 Scientific research at the Institute of Material Problems of the Science Academy, Kiev, Ukraine. Area of studies: plasma physics, composed materials.
1987 Promotion with the grade: Doctor of Engineering Sciences
1992 – 2006 hema electronic GmbH, Aalen, Department: machine vision, Development engineer, Project director. Main topic: Algorithmics for defect recognition on edges and surfaces
Since April 2006 Thermosensorik GmbH, Erlangen, Manager Software Engineering, IP Expert
Bibliographic Information
Book Title: Image Processing of Edge and Surface Defects
Book Subtitle: Theoretical Basis of Adaptive Algorithms with Numerous Practical Applications
Authors: Roman Louban
Series Title: Springer Series in Materials Science
DOI: https://doi.org/10.1007/978-3-642-00683-8
Publisher: Springer Berlin, Heidelberg
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer-Verlag Berlin Heidelberg 2009
Hardcover ISBN: 978-3-642-00682-1Published: 16 September 2009
Softcover ISBN: 978-3-642-26035-3Published: 04 May 2012
eBook ISBN: 978-3-642-00683-8Published: 16 September 2009
Series ISSN: 0933-033X
Series E-ISSN: 2196-2812
Edition Number: 1
Number of Pages: XI, 168
Number of Illustrations: 120 b/w illustrations, 8 illustrations in colour
Topics: Materials Science, general, Optics, Lasers, Photonics, Optical Devices, Solid State Physics, Spectroscopy and Microscopy, Engineering, general