Applied Scanning Probe Methods VIII

Scanning Probe Microscopy Techniques

  • Bharat Bhushan
  • Harald Fuchs
  • Masahiko Tomitori

Part of the Nano Science and Technolgy book series (NANO)

Table of contents

  1. Front Matter
    Pages I-LIX
  2. Pietro Giuseppe Gucciardi, Guillaume Bachelier, Stephan J. Stranick, Maria Allegrini
    Pages 1-29
  3. Hao-Chih Liu, Gregory A. Dahlen, Jason R. Osborne
    Pages 31-75
  4. Eugenio Cefalì, Salvatore Patanè, Salvatore Spadaro, Renato Gardelli, Matteo Albani, Maria Allegrini
    Pages 77-135
  5. Sophie Marsaudon, Charlotte Bernard, Dirk Dietzel, Cattien V. Nguyen, Anne Marie Bonnot, Jean-Pierre Aimé et al.
    Pages 137-181
  6. Andrea M. Ho, Horacio D. Espinosa
    Pages 183-217
  7. Hayato Sone, Sumio Hosaka
    Pages 219-245
  8. Peter J. Cumpson, Charles A. Clifford, Jose F. Portoles, James E. Johnstone, Martin Munz
    Pages 289-314
  9. Suzanne P. Jarvis, John E. Sader, Takeshi Fukuma
    Pages 315-350
  10. Yossi Rosenwaks, Oren Tal, Shimon Saraf, Alex Schwarzman, Eli Lepkifker, Amir Boag
    Pages 351-376
  11. Laura Fumagalli, Ignacio Casuso, Giorgio Ferrari, G. Gomila
    Pages 421-450
  12. Back Matter
    Pages 451-465

About this book

Introduction

The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale. Vol. IX focuses on characterization of material surfaces including structural as well as local mechanical characterization, and molecular systems. The volume covers a broad spectrum of STM/AFM investigations including fullerene layers, force spectroscopy for probing material properties in general, biological lms .and cells, epithelial and endothelial layers, medical related systems such as amyloidal aggregates, phospholipid monolayers, inorganic lms on aluminium and copper - ides,tribological characterization, mechanical properties ofpolymernanostructures, technical polymers, and near eld optics.

Keywords

AFM Nanotube PES carbon nanotubes ceramics liquid microscopy polymer

Editors and affiliations

  • Bharat Bhushan
    • 1
  • Harald Fuchs
    • 2
  • Masahiko Tomitori
    • 3
  1. 1.Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM)The Ohio State UniversityColumbusUSA
  2. 2.Institute of Physics, FB 16University of MünsterMünsterGermany
  3. 3.Advanced Institute of Science & TechnologySchool of Materials ScienceIshikawaJapan

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-540-74080-3
  • Copyright Information Springer-Verlag Berlin Heidelberg 2008
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Chemistry and Materials Science
  • Print ISBN 978-3-540-74079-7
  • Online ISBN 978-3-540-74080-3
  • Series Print ISSN 1434-4904
  • Series Online ISSN 2197-7127
  • About this book