Particle Image Velocimetry

New Developments and Recent Applications

  • Andreas Schroeder
  • Christian E. Willert

Part of the Topics in Applied Physics book series (TAP, volume 112)

Table of contents

  1. Front Matter
    Pages I-XVIII
  2. Dominik P. J. Barz, Hamid Farangis Zadeh, Peter Ehrhard
    Pages 1-18
  3. Michael Schlter, Marko Hoffmann, Norbert Rbiger
    Pages 19-33
  4. Sebastian Groß e, Wolfgang Schröder, Michael Klaas
    Pages 35-53
  5. Radoslav Kaminsky, Stephan Kallweit, Massimiliano Rossi, Umberto Morbiducci, Lorenzo Scalise, Pascal Verdonck et al.
    Pages 55-72
  6. Raf Theunissen, Michel L. Riethmuller
    Pages 73-101
  7. Gerrit E. Elsinga, Bernhard Wieneke, Fulvio Scarano, Andreas Schröder
    Pages 103-125
  8. M. Pilar Arroyo, Klaus D. Hinsch
    Pages 127-154
  9. Mokrane Malek, Denis Lebrun, Daniel Allano
    Pages 155-170
  10. Thomas Ooms, Victor Chan, Jerry Westerweel, Wouter Koek, Nandini Bhattacharya, Joseph Braat
    Pages 171-189
  11. Jie Lin, Jean-Marc Foucaut, Jean-Philippe Laval, Nicolas Pérenne, Michel Stanislas
    Pages 191-221
  12. Rodolphe Perrin, Charles Mockett, Marianna Braza, Emmanuel Cid, Sébastien Cazin, Alain Sevrain et al.
    Pages 223-244
  13. Lucio Araneo, Aldo Coghe, Fabio Cozzi, Andrea Olivani, Giulio Solero
    Pages 245-257
  14. Massimiliano Rossi, Enrico Esposito, Enrico Primo Tomasini
    Pages 259-270
  15. Enrico Primo Tomasini, Nicola Paone, Massimiliano Rossi, Paolo Castellini
    Pages 271-281
  16. Christian Willert, Guido Stockhausen, Melanie Voges, Joachim Klinner, Richard Schodl, Christoph Hassa et al.
    Pages 283-309
  17. Stefan Dankers, Mark Gotthardt, Thomas Stengler, Gerhard Ohmstede, Werner Hentschel
    Pages 333-343
  18. David Towers, Catherine Towers
    Pages 345-361
  19. Davide Cardano, Giuseppe Carlino, Antonello Cogotti
    Pages 363-376
  20. Carl F. v. Carmer, André Heider, Andreas Schröder, Robert Konrath, Janos Agocs, Anne Gilliot et al.
    Pages 377-394
  21. José Nogueira, Mathieu Legrand, Sara Nauri, Pedro A. Rodríguez, Antonio Lecuona
    Pages 419-428
  22. M. Havermann, J. Haertig, C. Rey, A. George
    Pages 429-443
  23. Fulvio Scarano
    Pages 445-463
  24. Bas W. van Oudheusden, Fulvio Scarano
    Pages 465-474
  25. Fabio Di Felice, Francisco Pereira
    Pages 475-503
  26. Back Matter
    Pages 505-512

About this book


Particle Image Velocimetry (PIV) is a non-intrusive optical measurement technique which allows capturing several thousand velocity vectors within large flow fields instantaneously. Today, the PIV technique has spread widely and differentiated into many distinct applications, from micro flows over combustion to supersonic flows for both industrial needs and research. Over the past decade the measurement technique and the hard- and software have been improved continuously so that PIV has become a reliable and accurate method for "real life" investigations. Nevertheless there is still an ongoing process of improvements and extensions of the PIV technique towards 3D, time resolution, higher accuracy, measurements under harsh conditions and micro- and macroscales. This book gives a synopsis of the main results achieved during the EC-funded network PivNet 2 as well as a survey of the state-of-the-art of scientific research using PIV techniques in different fields of application.


Particle Image Velocimetry Planar Tracking aerodynamics basics dynamics fluid dynamics fluid mechanics holography imaging machine mechanics network simulation turbulence

Editors and affiliations

  • Andreas Schroeder
    • 1
  • Christian E. Willert
    • 2
  1. 1.Institut für Strömungstechnik und Aerodynamik Experimentelle VerfahrenDeutsches Zentrum für Luft- und Raumfahrt (DLR)GöttingenGermany
  2. 2.Institut für Antriebstechnik TriebwerksmesstechnikDeutsches Zentrum für Luft- und Raumfahrt (DLR)KölnGermany

Bibliographic information

  • DOI
  • Copyright Information Springer-Verlag Berlin/Heidelberg 2008
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Physics and Astronomy
  • Print ISBN 978-3-540-73527-4
  • Online ISBN 978-3-540-73528-1
  • Series Print ISSN 0303-4216
  • Series Online ISSN 1437-0859
  • Buy this book on publisher's site