© 2007

Applied Scanning Probe Methods V

Scanning Probe Microscopy Techniques

  • Bharat Bhushan
  • Satoshi Kawata
  • Harald Fuchs

Part of the NanoScience and Technology book series (NANO)

Table of contents

  1. Front Matter
    Pages I-XLV
  2. Sadik Hafizovic, Kay-Uwe Kirstein, Andreas Hierlemann
    Pages 1-22
  3. Yasuhisa Ando
    Pages 23-49
  4. Hendrik Hölscher, Daniel Ebeling, Udo D. Schwarz
    Pages 75-97
  5. Hideki Kawakatsu
    Pages 99-112
  6. Chanmin Su, Lin Huang, Craig B. Prater, Bharat Bhushan
    Pages 113-148
  7. Yaxin Song, Bharat Bhushan
    Pages 149-223
  8. Justyna Wiedemair, Boris Mizaikoff, Christine Kranz
    Pages 225-267
  9. Robert Szoszkiewicz, Elisa Riedo
    Pages 269-286
  10. Pietro Giuseppe Gucciardi, Sebastiano Trusso, Cirino Vasi, Salvatore Patanè, Maria Allegrini
    Pages 287-329
  11. Back Matter
    Pages 331-344

About this book


The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I–IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series. In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near?eld Raman spectroscopy and imaging.


AFM PES REM Raman spectroscopy ceramics elasticity liquid microscopy modeling polymer spectroscopy

Editors and affiliations

  • Bharat Bhushan
    • 1
  • Satoshi Kawata
    • 2
  • Harald Fuchs
    • 3
  1. 1.Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM) W390 Scott LaboratoryThe Ohio State UniversityColumbusUSA
  2. 2.Department of MathematicsOsaka City University, Graduate School of ScienceOsakaJapan
  3. 3.Center for Nanotechnology (CeNTech) and Institute of PhysicsUniversity of MünsterMünsterGermany

Bibliographic information