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Handbook of Practical X-Ray Fluorescence Analysis

  • Burkhard Beckhoff
  • habil. Birgit Kanngießer
  • Norbert Langhoff
  • Reiner Wedell
  • Helmut Wolff

Table of contents

  1. Front Matter
    Pages I-XXIV
  2. Tomoya Arai
    Pages 1-31
  3. Norbert Langhoff, Alexandre Simionovici, Vladimir Arkadiev, Wolfgang Knüpfer, Tomáš Čechák, Jürgen Leonhardt et al.
    Pages 33-83
  4. Alexei Erko, Vladimir Arkadiev, Aniouar Bjeoumikhov, Alexander Antonov, Burkhard Beckhoff, Inna Grigorieva et al.
    Pages 85-198
  5. Frank Scholze, Antonio Longoni, Carlo Fiorini, Lothar Strüder, Norbert Meidinger, Robert Hartmann et al.
    Pages 199-308
  6. Michael Mantler, James Willis, Gerald Lachance, Bruno A. R. Vrebos, Karl-Eugen Mauser, Naoki Kawahara et al.
    Pages 309-410
  7. Jasna Injuk, RenÉ Van Grieken, Avram Blank, Lyudmyla Eksperiandova, Victor Buhrke
    Pages 411-432
  8. Birgit Kanngießer, Michael Haschke, Alexandre Simionovici, Pierre Chevallier, Christina Streli, Peter Wobrauschek et al.
    Pages 433-833
  9. Peter Ambrosi, Reiner Wedell, Wolfgang Malzer
    Pages 835-848
  10. Back Matter
    Pages 849-878

About this book

Introduction

X-Ray Fluorescence analysis (XRF) is a reliable multi-elemental and nondestructive analytical method widely used in research and industrial applications. This practical handbook provides self-contained modules featuring XRF instrumentation, quantification methods, and most of the current applications. The broad spectrum of topics is due to the efforts of a large number of authors from a variety of different types of institutions such as universities, research institutes, and companies.  The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. This practical handbook is intended as a resource for graduate students, research scientists, and industrial users

Keywords

Element analysis Heavy metals KLT KLTcatalog PES Process control REM Trace element analysis X-ray fluorescence diffraction fluorescence spectroscopy spectroscopy

Editors and affiliations

  • Burkhard Beckhoff
    • 1
  • habil. Birgit Kanngießer
    • 2
  • Norbert Langhoff
    • 3
  • Reiner Wedell
    • 4
  • Helmut Wolff
    • 5
  1. 1.Physikalisch-Technische BundesanstaltX-ray SpectrometryBerlinGermany
  2. 2.Technische Universität Berlin, Fakultät 2Institut für Atomare Physik und FachdidaktikBerlinGermany
  3. 3.IfG-Institute for Scientific Instruments GmbHBerlinGermany
  4. 4.Institut für Angewandte Photonik e.V.BerlinGermany
  5. 5.Institut für Angewandte Photonik e.V.BerlinGermany

Bibliographic information