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Lock-in Thermography

Basics and Use for Evaluating Electronic Devices and Materials

  • Otwin Breitenstein
  • Wilhelm Warta
  • Martin C. Schubert

Part of the Springer Series in Advanced Microelectronics book series (MICROELECTR., volume 10)

Table of contents

  1. Front Matter
    Pages i-xxi
  2. Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert
    Pages 1-6
  3. Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert
    Pages 7-62
  4. Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert
    Pages 63-100
  5. Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert
    Pages 101-148
  6. Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert
    Pages 149-178
  7. Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert
    Pages 179-295
  8. Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert
    Pages 297-300
  9. Back Matter
    Pages 301-321

About this book

Introduction

This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included.


Keywords

Solar Cell Characterization Shunt Imaging IC Failure Analysis Electronic Device Failure Analysis Trap Density Mapping Non-thermal LIT lifetime mapping LIT application to spin caloritronics problems Illuminated LIT applied to solar cells Power devices for electric cars

Authors and affiliations

  • Otwin Breitenstein
    • 1
  • Wilhelm Warta
    • 2
  • Martin C. Schubert
    • 3
  1. 1.Max Planck Institute of Microstructure PhysicsHalleGermany
  2. 2.Fraunhofer Institute for Solar Energy SystemsFreiburgGermany
  3. 3.Fraunhofer Institute for Solar Energy SystemsFreiburgGermany

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-319-99825-1
  • Copyright Information Springer Nature Switzerland AG 2018
  • Publisher Name Springer, Cham
  • eBook Packages Physics and Astronomy
  • Print ISBN 978-3-319-99824-4
  • Online ISBN 978-3-319-99825-1
  • Series Print ISSN 1437-0387
  • Series Online ISSN 2197-6643
  • Buy this book on publisher's site