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Reliability Physics and Engineering

Time-To-Failure Modeling

  • J. W. McPherson

Table of contents

  1. Front Matter
    Pages i-xvii
  2. J. W. McPherson
    Pages 1-3
  3. J. W. McPherson
    Pages 5-31
  4. J. W. McPherson
    Pages 67-80
  5. J. W. McPherson
    Pages 81-91
  6. J. W. McPherson
    Pages 93-107
  7. J. W. McPherson
    Pages 109-124
  8. J. W. McPherson
    Pages 125-136
  9. J. W. McPherson
    Pages 137-147
  10. J. W. McPherson
    Pages 149-164
  11. J. W. McPherson
    Pages 331-352
  12. J. W. McPherson
    Pages 365-380
  13. J. W. McPherson
    Pages 381-417
  14. J. W. McPherson
    Pages 419-441
  15. Back Matter
    Pages 443-463

About this book

Introduction

This third edition textbook provides the basics of reliability physics and engineering that are needed by electrical engineers, mechanical engineers, civil engineers, biomedical engineers, materials scientists, and applied physicists to help them to build better devices/products. The information contained within should help all fields of engineering to develop better methodologies for: more reliable product designs, more reliable materials selections, and more reliable manufacturing processes— all of which should help to improve product reliability. A mathematics level through differential equations is needed. Also, a familiarity with the use of excel spreadsheets is assumed. Any needed statistical training and tools are contained within the text. While device failure is a statistical process (thus making statistics important), the emphasis of this book is clearly on the physics of failure and developing the reliability engineering tools required for product improvements during device-design and device-fabrication phases.


  • Provides a comprehensive textbook on reliability physics of semiconductors, from fundamentals to applications;
  • Explains the fundamentals of reliability physics and engineering tools for building better products;
  • Contains statistical training and tools within the text;
  • Includes new chapters on Physics of Degradation, and Resonance and Resonance-Induced Degradation.


Keywords

Device Reliability Failure Modeling and statistics Failure Rate Reduction Maintenance and Reliability Probabilistic Models and Statistical Modeling Quality Assurance Engineering Reliability Engineering

Authors and affiliations

  • J. W. McPherson
    • 1
  1. 1.McPherson Reliability Consulting, LLCPlanoUSA

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-319-93683-3
  • Copyright Information Springer Nature Switzerland AG 2019
  • Publisher Name Springer, Cham
  • eBook Packages Engineering
  • Print ISBN 978-3-319-93682-6
  • Online ISBN 978-3-319-93683-3
  • Buy this book on publisher's site