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Ellipsometry of Functional Organic Surfaces and Films

  • Karsten Hinrichs
  • Klaus-Jochen Eichhorn

Part of the Springer Series in Surface Sciences book series (SSSUR, volume 52)

Table of contents

  1. Front Matter
    Pages i-xxvi
  2. Christoph Cobet
    Pages 1-27
  3. Biomolecules at Surfaces

    1. Front Matter
      Pages 29-29
    2. Simona D. Pop, Karsten Hinrichs, Sylvia Wenmackers, Christoph Cobet, Norbert Esser, Dietrich R. T. Zahn
      Pages 49-62
    3. Pietro Parisse, Ilaria Solano, Michele Magnozzi, Francesco Bisio, Loredana Casalis, Ornella Cavalleri et al.
      Pages 63-93
  4. Smart Polymer Surfaces and Films

    1. Front Matter
      Pages 95-95
    2. Michael Erber, Martin Tress, Eva Bittrich, Lars Bittrich, Klaus-Jochen Eichhorn
      Pages 97-114
    3. Eva Bittrich, Andreas Furchner, Meike Koenig, Dennis Aulich, Petra Uhlmann, Karsten Hinrichs et al.
      Pages 115-143
  5. Nanostructured Surfaces and Organic/Inorganic Hybrids

    1. Front Matter
      Pages 197-197
    2. Thomas W. H. Oates
      Pages 199-223
    3. Kenneth Järrendahl, Hans Arwin
      Pages 247-268
  6. Thin Films of Organic Semiconductors for OPV, OLEDs and OTFT

    1. Front Matter
      Pages 269-269
    2. Stergios Logothetidis
      Pages 271-294
    3. Ovidiu D. Gordan, Dietrich R. T. Zahn
      Pages 295-317
    4. Maria Isabel Alonso, Mariano Campoy-Quiles
      Pages 335-353
    5. Christoph Cobet, Jacek Gasiorowski, Dominik Farka, Philipp Stadler
      Pages 355-387
  7. Developments in Ellipsometric Real-Time/In-situ Monitoring Techniques

    1. Front Matter
      Pages 389-389
    2. Ralf P. Richter, Keith B. Rodenhausen, Nico B. Eisele, Mathias Schubert
      Pages 391-417
    3. Jörg Rappich, Karsten Hinrichs, Guoguang Sun, Xin Zhang
      Pages 459-479
  8. Infared Spectroscopic Methods for Characterization of Thin Organic Films

    1. Front Matter
      Pages 481-481
    2. Katy Roodenko, Damien Aureau, Florent Yang, Peter Thissen, Jörg Rappich
      Pages 483-503
  9. Optical Constants

    1. Front Matter
      Pages 519-519
    2. Andreas Furchner, Dennis Aulich
      Pages 521-527
    3. Andreas Furchner, Dennis Aulich
      Pages 529-538
  10. Back Matter
    Pages 539-547

About this book

Introduction

This new edition provides a state-of-the-art survey of ellipsometric methods used to study organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. Thanks to the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices, the ellipsometric analysis of optical and material properties has made tremendous strides over the past few years.

The second edition has been updated to reflect the latest advances in ellipsometric methods. The new content focuses on the study of anisotropic materials, conjugated polymers, polarons, self-assembled monolayers, industrial membranes, adsorption of proteins, enzymes and RGD-peptides, as well as the correlation of ellipsometric spectra to structure and molecular interactions.

Keywords

Biomolecules at Surfaces Characterization of Organic Semiconductors Ellipsometric Real-time/In-situ Monitoring Techniques Functional and Smart Films Infrared Brillant Light Sources for Micro-ellipsometric Studies OLEDs and OTFT Optical Constants of Organic Layers Organic and Hybrid Materials Smart Polymer Surfaces and Films In-Situ Monitoring Techniques Microscopic and imaging ellipsometry

Editors and affiliations

  1. 1.Leibniz-Institut für Analytische Wissenschaften – ISAS – e.V.BerlinGermany
  2. 2.Abteilung AnalytikLeibniz-Institut für Polymerforschung Dresden e.V.DresdenGermany

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-319-75895-4
  • Copyright Information Springer International Publishing AG, part of Springer Nature 2018
  • Publisher Name Springer, Cham
  • eBook Packages Physics and Astronomy
  • Print ISBN 978-3-319-75894-7
  • Online ISBN 978-3-319-75895-4
  • Series Print ISSN 0931-5195
  • Series Online ISSN 2198-4743
  • Buy this book on publisher's site