Industrial X-Ray Computed Tomography

  • Simone Carmignato
  • Wim Dewulf
  • Richard Leach

Table of contents

  1. Front Matter
    Pages i-vii
  2. Adam Thompson, Richard Leach
    Pages 1-23
  3. Petr Hermanek, Jitendra Singh Rathore, Valentina Aloisi, Simone Carmignato
    Pages 25-67
  4. Evelina Ametova, Gabriel Probst, Wim Dewulf
    Pages 69-98
  5. Christoph Heinzl, Alexander Amirkhanov, Johann Kastner
    Pages 99-142
  6. Alessandro Stolfi, Leonardo De Chiffre, Stefan Kasperl
    Pages 143-184
  7. Markus Bartscher, Ulrich Neuschaefer-Rube, Jens Illemann, Fabrício Borges de Oliveira, Alessandro Stolfi, Simone Carmignato
    Pages 185-228
  8. Massimiliano Ferrucci
    Pages 229-266
  9. Martine Wevers, Bart Nicolaï, Pieter Verboven, Rudy Swennen, Staf Roels, Els Verstrynge et al.
    Pages 267-331
  10. Andrea Buratti, Judith Bredemann, Michele Pavan, Robert Schmitt, Simone Carmignato
    Pages 333-369

About this book


This book covers all aspects of industrial X-Ray computed tomography (XCT) including history, basics, different instrument architectures, hardware and software, error sources, traceability and calibration, and applications. The book is intended for users and developers of XCT instrumentation and software in both industry and academia, being also suitable for postgraduate students.


CT Dimensional Measurement CT Scanning Industry CT System Calibration Data Processing Workflow Image Artifacts Measurement Uncertainty Determination Nondestructive Materials Testing Reference Objects Surface Determination

Editors and affiliations

  • Simone Carmignato
    • 1
  • Wim Dewulf
    • 2
  • Richard Leach
    • 3
  1. 1.Department of Management and EngineeringUniversity of PadovaVicenzaItaly
  2. 2.Department of Mechanical EngineeringKU LeuvenLeuvenBelgium
  3. 3.University of NottinghamNottinghamUnited Kingdom

Bibliographic information