Spectroscopic Analysis of Optoelectronic Semiconductors

  • Juan Jimenez
  • Jens W. Tomm
Part of the Springer Series in Optical Sciences book series (SSOS, volume 202)

Table of contents

  1. Front Matter
    Pages i-xi
  2. Juan Jimenez, Jens W. Tomm
    Pages 1-48
  3. Juan Jimenez, Jens W. Tomm
    Pages 77-142
  4. Juan Jimenez, Jens W. Tomm
    Pages 143-211
  5. Juan Jimenez, Jens W. Tomm
    Pages 213-263
  6. Juan Jimenez, Jens W. Tomm
    Pages 265-300
  7. Back Matter
    Pages 301-307

About this book

Introduction

This book deals with standard spectroscopic techniques which can be used to analyze semiconductor samples or devices, in both, bulk, micrometer and submicrometer scale. The book aims helping experimental physicists and engineers to choose the right analytical spectroscopic technique in order to get specific information about their specific demands. For this purpose, the techniques including technical details such as apparatus and probed sample region are described. More important, also the expected outcome from experiments is provided. This involves also the link to theory, that is not subject of this book, and the link to current experimental results in the literature which are presented in a review-like style. Many special spectroscopic techniques are introduced and their relationship to the standard techniques is revealed. Thus the book works also as a type of guide or reference book for people researching in optical spectroscopy of semiconductors.

Keywords

Analytical semiconductor spectroscopy Cathodoluminescence Luminescence techniques Photoelectrical properties of semiconductors Photoelectrical spectroscopy Photoluminescence techniques Raman spectroscopy Spectroscopic equipment and methods

Authors and affiliations

  • Juan Jimenez
    • 1
  • Jens W. Tomm
    • 2
  1. 1.Condensed Matter PhysicsUniversity of ValladolidValladolidSpain
  2. 2.Max-Born-Institut für Nichtlineare Optik und KurzzeitspektroskopieBerlinGermany

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-319-42349-4
  • Copyright Information Springer International Publishing Switzerland 2016
  • Publisher Name Springer, Cham
  • eBook Packages Physics and Astronomy
  • Print ISBN 978-3-319-42347-0
  • Online ISBN 978-3-319-42349-4
  • Series Print ISSN 0342-4111
  • Series Online ISSN 1556-1534
  • About this book