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Mechanical Properties of Polymers Measured through AFM Force-Distance Curves

  • Brunero Cappella

Part of the Springer Laboratory book series (SPLABORATORY)

Table of contents

  1. Front Matter
    Pages i-xiv
  2. Principles: Theory and Practice

    1. Front Matter
      Pages 1-1
    2. Brunero Cappella
      Pages 67-91
  3. Case Studies: Mechanical Properties of Homogeneous Polymer Films, Thin Polymer Films and Polymer Blends

    1. Front Matter
      Pages 93-93
    2. Brunero Cappella
      Pages 95-154
    3. Brunero Cappella
      Pages 155-185
    4. Brunero Cappella
      Pages 187-219
    5. Brunero Cappella
      Pages 221-230
  4. Back Matter
    Pages 231-233

About this book

Introduction

This Springer Laboratory volume is a practical guide for scientists and students dealing with the measurement of mechanical properties of polymers at the nanoscale through AFM force-distance curves.
In the first part of the book the reader will find a theoretical introduction about atomic force microscopy, focused on force-distance curves, and mechanical properties of polymers. The discussion of several practical issues concerning the acquisition and the interpretation of force-distance curves will help scientists starting to employ this technique.
The second part of the book deals with the practical measurement of mechanical properties of polymers by means of AFM force-distance curves. Several "hands-on" examples are illustrated in a very detailed manner, with particular attention to the sample preparation, data analysis, and typical artefacts. This section gives a complete overview about the qualitative characterization and quantitative determination of the mechanical properties of homogeneous polymer samples, polymer brushes, polymer thin films, confined polymer samples, model blends and microstructured polymer blends through AFM force-distance curves.
The book also introduces to new approaches and measurement techniques, like creep compliance and force modulation measurements, pointing out approximations, limitations and issues requiring further confirmation.

Keywords

Atomic Force Microscopy Confined polymer samples Creep compliance measurement Force-distance curves Force-modulation measurement Mechanical properties of polymers Polymer blends Polymer nanoscale properties Sample preparation AFM Thin polymer films

Authors and affiliations

  • Brunero Cappella
    • 1
  1. 1.BAMFederal Institute of Materials Research and TestingBerlinGermany

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-319-29459-9
  • Copyright Information Springer International Publishing Switzerland 2016
  • Publisher Name Springer, Cham
  • eBook Packages Chemistry and Materials Science
  • Print ISBN 978-3-319-29457-5
  • Online ISBN 978-3-319-29459-9
  • Series Print ISSN 0945-6074
  • Series Online ISSN 2196-1174
  • Buy this book on publisher's site