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Touschek Lifetime Studies and Optimization of the European Synchrotron Radiation Facility

Present and Upgrade Lattice

  • Nicola Carmignani

Part of the Springer Theses book series (Springer Theses)

Table of contents

  1. Front Matter
    Pages i-x
  2. Nicola Carmignani
    Pages 9-18
  3. Nicola Carmignani
    Pages 19-41
  4. Nicola Carmignani
    Pages 43-52
  5. Nicola Carmignani
    Pages 67-71
  6. Back Matter
    Pages 73-102

About this book

Introduction

This thesis describes the experimental and theoretical basics of free electron laser science, serving as an excellent introduction for newcomers to this young field. Beyond that, it addresses electron-beam lifetimes in third-generation synchrotron light sources, in particular with a view to optimizing them in the forthcoming ESRF upgrade.

The lifetime of the electron beam in a storage ring is a measure of how fast electrons are being lost, and is thus an essential parameter determining the required injection frequency, which in turn affects beam stability and power consumption. The main limitation on the beam lifetime in these synchrotron light sources is the Touschek effect, i.e. the single scattering between two electrons in a bunch. In this thesis a model able to predict the Touschek lifetime is presented. The model is successfully tested against measurements and used to study the influence of other parameters such as current and size of vacuum chamber. Not least, it enables the settings of sextupole magnets to be optimized.

Keywords

Low emittance ring Touschek lifetime Synchrotron light source Dynamic aperture ESRF Upgrade Sextupole optimization

Authors and affiliations

  • Nicola Carmignani
    • 1
  1. 1.—European Synchrotron Radiation FacilityGrenobleFrance

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-319-25798-3
  • Copyright Information Springer International Publishing Switzerland 2016
  • Publisher Name Springer, Cham
  • eBook Packages Physics and Astronomy
  • Print ISBN 978-3-319-25797-6
  • Online ISBN 978-3-319-25798-3
  • Series Print ISSN 2190-5053
  • Series Online ISSN 2190-5061
  • Buy this book on publisher's site