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Development of Infrared Techniques for Practical Defect Identification in Bonded Joints

  • Rachael C.¬†Waugh

Part of the Springer Theses book series (Springer Theses)

Table of contents

  1. Front Matter
    Pages i-xxviii
  2. Rachael C. Waugh
    Pages 1-7
  3. Rachael C. Waugh
    Pages 9-20
  4. Rachael C. Waugh
    Pages 21-37
  5. Rachael C. Waugh
    Pages 39-57
  6. Rachael C. Waugh
    Pages 59-76
  7. Rachael C. Waugh
    Pages 77-95
  8. Rachael C. Waugh
    Pages 97-106
  9. Rachael C. Waugh
    Pages 107-113
  10. Rachael C. Waugh
    Pages 115-144
  11. Rachael C. Waugh
    Pages 145-149

About this book

Introduction

Maximizing reader insights into the use of thermography, specifically pulsed and pulse phase thermography (PT and PPT), for the identification of kissing defects in adhesive bonds, this thesis focuses on the application of PT and PPT for the identification of a range of defect types in a variety of materials to establish the effect of material properties on identification of defects.

Featuring analysis of a numerical model developed to simulate the thermal evolution created during a PT or PPT experiment, after validation through a series of case studies, this model is then used as a predictive tool to relate defect detectability to the thermal property contrast between defect and bulk materials.

Demonstrating a means of producing realistic kissing defects in bonded joints where insufficient thermal property contrast exists defects have a limited effect on heat propagation through a component and therefore are not detected using PT or PPT, this thesis discusses the addition of a small load to bonds containing kissing defects which was found to open the defects sufficiently to enable their detection.

A low cost infrared detector, Flir Tau320, is compared to the research based photon detector, Flir SC5000, and is shown to be suitable for application in PT, thus enabling a significantly lower cost tool to be developed.

Keywords

Advanced Ultrasonic Techniques Flir Tau320 Kissing Defects Identification of Kissing Defects Infrared Detector Kissing Defects Kissing Defects in Adhesive Bonds Kissing Defects in Bonded Joints PPT Adhesive Bonds Pulse Phase Thermography

Authors and affiliations

  • Rachael C.¬†Waugh
    • 1
  1. 1.University RoadFaculty of Engineering and the Environment,University of SouthamptonSouthamptonUnited Kingdom

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-319-22982-9
  • Copyright Information Springer International Publishing Switzerland 2016
  • Publisher Name Springer, Cham
  • eBook Packages Chemistry and Materials Science
  • Print ISBN 978-3-319-22981-2
  • Online ISBN 978-3-319-22982-9
  • Series Print ISSN 2190-5053
  • Series Online ISSN 2190-5061
  • Buy this book on publisher's site