Sensors and Instrumentation, Volume 5

Proceedings of the 33rd IMAC, A Conference and Exposition on Structural Dynamics, 2015

  • Evro Wee Sit
Conference proceedings

Table of contents

  1. Front Matter
    Pages i-vii
  2. Brandon J. Dilworth
    Pages 1-9
  3. Kyle Embry, Andrea Hengartner-Cuellar, Hannah Ross, David Mascareñas
    Pages 11-22
  4. Tong Wang, Ozan Celik, F. Necati Catbas, Lingmi Zhang
    Pages 23-29
  5. Huinam Rhee, Sangjin Park, Sergii A. Sarapuloff, Soon Woo Han, Jin Ho Park
    Pages 31-35
  6. E. Belloni, D. Milani, F. Braghin
    Pages 37-44
  7. N.-G. Kim, T. McCulloch, J.-J. Lee, H.-B. Yun
    Pages 45-51
  8. James Long, Jeffrey K. Swidrak, Michael Y. Feng, Oral Buyukozturk
    Pages 53-60
  9. Leonard Klaus, Michael Kobusch, Thomas Bruns
    Pages 61-71

About these proceedings


Model Validation and Uncertainty Quantification, Volume 3.  Proceedings of the 33rd IMAC, A Conference and Exposition on Balancing Simulation and Testing, 2015, the third volume of ten from the Conference brings together contributions to this important area of research and engineering.  The collection presents early findings and case studies on fundamental and applied aspects of Structural Dynamics, including papers on:

Uncertainty Quantification & Model Validation

Uncertainty Propagation in Structural Dynamics

Bayesian & Markov Chain Monte Carlo Methods

Practical Applications of MVUQ

Advances in MVUQ & Model Updating


Finite Element Techniques IMAC 2015 Model Updating, Experimental Dynamics Substructuring Model Validation Sensors and Instrumentation Society for Experimental Mechanics Uncertainty Quantification

Editors and affiliations

  • Evro Wee Sit
    • 1
  1. 1.SVcommunity.comHermosa BeachUSA

Bibliographic information

  • DOI
  • Copyright Information The Society for Experimental Mechanics, Inc. 2015
  • Publisher Name Springer, Cham
  • eBook Packages Engineering Engineering (R0)
  • Print ISBN 978-3-319-15211-0
  • Online ISBN 978-3-319-15212-7
  • Series Print ISSN 2191-5644
  • Series Online ISSN 2191-5652
  • Buy this book on publisher's site