Atomic Force Microscopy

  • Bert Voigtländer

Part of the NanoScience and Technology book series (NANO)

Table of contents

  1. Front Matter
    Pages i-xiv
  2. Bert Voigtländer
    Pages 1-13
  3. Bert Voigtländer
    Pages 15-33
  4. Bert Voigtländer
    Pages 35-67
  5. Bert Voigtländer
    Pages 69-86
  6. Bert Voigtländer
    Pages 119-123
  7. Bert Voigtländer
    Pages 125-135
  8. Bert Voigtländer
    Pages 137-147
  9. Bert Voigtländer
    Pages 161-176
  10. Bert Voigtländer
    Pages 199-208
  11. Bert Voigtländer
    Pages 231-253
  12. Bert Voigtländer
    Pages 287-300
  13. Bert Voigtländer
    Pages 301-307
  14. Back Matter
    Pages 309-331

About this book


This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.


Scanning Probe Microscopy Lock-In Technique Artifacts in SPM Kelvin Probe Microscopy Static Atomic Force Microscopy Dynamic Atomic Force Microscopy

Authors and affiliations

  • Bert Voigtländer
    • 1
  1. 1.PGI-3Forschungszentrum JülichJülichGermany

Bibliographic information

  • DOI
  • Copyright Information Springer Nature Switzerland AG 2019
  • Publisher Name Springer, Cham
  • eBook Packages Chemistry and Materials Science
  • Print ISBN 978-3-030-13653-6
  • Online ISBN 978-3-030-13654-3
  • Series Print ISSN 1434-4904
  • Series Online ISSN 2197-7127
  • Buy this book on publisher's site