Overview
- Offers a full color pedagogic approach to atomic force microscopy
- Presents the fundamentals of the technique in detail
- Discusses related technical aspects in depth
Part of the book series: NanoScience and Technology (NANO)
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Table of contents (18 chapters)
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Front Matter
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Back Matter
Keywords
About this book
This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.
Reviews
“Whether readers are just starting in the field or running an atomic force microscope daily, Voigtländer’s Atomic Force Microscopy will be an excellent companion. It will usefully complement the user manual or the application notes of any instrument. I wish it had been available when I was beginning my journey in nanoscience instrumentation 15 years ago, and I will certainly use it as a reference book for all the students coming through our laboratory’s door from now on.” (Ludovic Bellon, Physics Today, Vol. 73 (5), May, 2020)
Authors and Affiliations
About the author
Prof. Dr. rer. nat. Bert Voigtländer studied Physics at the University of Cologne and the RWTH Aachen University, earning his Ph.D. in 1989. While a postdoctoral researcher at the IBM Research Center in Yorktown Heights, USA, he began his current field of research using scanning probe microscopy. As a staff scientist at the Jülich Research Centre (Forschungszentrum Jülich), his recent focus has been nanoscale charge transport measurements. In 2012, he founded the spin-off company mProbes, which offers multi-tip scanning probe microscopes. To date, he has authored and co-authored over 100 peer-reviewed publications.
Bibliographic Information
Book Title: Atomic Force Microscopy
Authors: Bert Voigtländer
Series Title: NanoScience and Technology
DOI: https://doi.org/10.1007/978-3-030-13654-3
Publisher: Springer Cham
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer Nature Switzerland AG 2019
Hardcover ISBN: 978-3-030-13653-6Published: 03 June 2019
Softcover ISBN: 978-3-030-13656-7Published: 14 August 2020
eBook ISBN: 978-3-030-13654-3Published: 23 May 2019
Series ISSN: 1434-4904
Series E-ISSN: 2197-7127
Edition Number: 2
Number of Pages: XIV, 331
Number of Illustrations: 28 b/w illustrations, 129 illustrations in colour
Topics: Spectroscopy and Microscopy, Nanotechnology, Nanotechnology and Microengineering, Nanoscale Science and Technology, Biological Microscopy