Micro-Relay Technology for Energy-Efficient Integrated Circuits

  • Hei Kam
  • Fred Chen

Part of the Microsystems and Nanosystems book series (MICRONANO, volume 1)

Table of contents

  1. Front Matter
    Pages i-x
  2. Hei Kam, Fred Chen
    Pages 1-11
  3. Hei Kam, Fred Chen
    Pages 13-46
  4. Hei Kam, Fred Chen
    Pages 47-68
  5. Hei Kam, Fred Chen
    Pages 69-80
  6. Hei Kam, Fred Chen
    Pages 103-135
  7. Hei Kam, Fred Chen
    Pages 137-179
  8. Back Matter
    Pages 181-183

About this book


This book describes the design of relay-based circuit systems from device fabrication to circuit micro-architectures. This book is ideal for both device engineers as well as circuit system designers and highlights the importance of co-design across design hierarchies when optimizing system performance (in this case, energy-efficiency). This book is ideal for researchers and engineers focused on semiconductors, integrated circuits, and energy efficient electronics.

This book also:

·         Covers microsystem fabrication, MEMS device design, circuit design, circuit micro-architecture, and CAD

·         Describes work previously done in the field and also lays the groundwork and criteria for future energy-efficient device and system design

·         Maximizes reader insights into the design and modeling of micro-relay, micro-relay reliability, integrated circuit design with micro-relays, and more


CMOS Energy Crisis Circuit Micro-architectures Integrated Circuit Design Micro-relay Circuit Micro-relay Reliability Micro-relay Technologies Micro-relays Modeling Relay-based Circuit Systems VLSI Applications

Authors and affiliations

  • Hei Kam
    • 1
  • Fred Chen
    • 2
  1. 1.Intel CorporationHillsboroUSA
  2. 2.Lion Semiconductor, Inc.BerkeleyUSA

Bibliographic information

  • DOI
  • Copyright Information Springer Science+Business Media New York 2015
  • Publisher Name Springer, New York, NY
  • eBook Packages Engineering
  • Print ISBN 978-1-4939-2127-0
  • Online ISBN 978-1-4939-2128-7
  • Series Print ISSN 2198-0063
  • Series Online ISSN 2198-0071
  • Buy this book on publisher's site