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Principles of Analytical Electron Microscopy

  • David C. Joy
  • Alton D. RomigJr.
  • Joseph I. Goldstein

Table of contents

  1. Front Matter
    Pages i-xvi
  2. R. H. Geiss, A. D. Romig Jr.
    Pages 29-76
  3. J. M. Cowley
    Pages 77-122
  4. D. B. Williams, J. I. Goldstein, C. E. Fiori
    Pages 123-153
  5. J. I. Goldstein, D. B. Williams, G. Cliff
    Pages 155-217
  6. T. A. Hall, B. L. Gupta
    Pages 219-248
  7. D. C. Joy
    Pages 249-276
  8. D. C. Joy
    Pages 277-299
  9. J. C. H. Spence, R. W. Carpenter
    Pages 301-352
  10. Back Matter
    Pages 445-448

About this book

Introduction

Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the "physics of the processes" and their practical implementation in modern instruments. It is the intent of the editors and authors of the current text, Principles of Analytical Electron Microscopy, to bring together, in one concise and readily accessible volume, these recent advances in the subject. The text begins with a thorough discussion of fundamentals to lay a foundation for today's state-of-the-art microscopy. All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention. To increase the utility of the volume to a broader cross section of the scientific community, the book's approach is, in general, more descriptive than mathematical. In some areas, however, mathematical concepts are dealt with in depth, increasing the appeal to those seeking a more rigorous treatment of the subject.

Keywords

X-Ray biology diffraction electron diffraction electron microscopy electron optics materials characterization microscopy spectroscopy

Editors and affiliations

  • David C. Joy
    • 1
  • Alton D. RomigJr.
    • 2
  • Joseph I. Goldstein
    • 3
  1. 1.AT&T Bell LaboratoriesMurray HillUSA
  2. 2.Sandia National LaboratoriesAlbuquerqueUSA
  3. 3.Lehigh UniversityBethlehemUSA

Bibliographic information