SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

  • Krishnendu Chakrabarty

Part of the Frontiers in Electronic Testing book series (FRET, volume 21)

Table of contents

  1. Front Matter
    Pages i-vii
  2. Overview

    1. Erik Jan Marinissen, Rohit Kapur, Maurice Lousberg, Teresa McLaurin, Mike Ricchetti, Yervant Zorian et al.
      Pages 1-19
  3. Test Planning, Access and Scheduling

    1. Erik Larsson, Zebo Peng, Krishnendu Chakrabarty
      Pages 21-36
    2. Yu Huang, Wu-Tung Cheng, Chien-Chung Tsai, Nilanjan Mukherjee, Omer Samman, Yahya Zaidan et al.
      Pages 37-50
    3. Mounir Benabdenbi, Walid Maroufi, Meryem Marzouki, Krishnendu Chakrabarty
      Pages 91-109
    4. Subhayu Basu, Indranil Sengupta, Dipanwita Roy Chowdhury, Sudipta Bhawmik, Krishnendu Chakrabarty
      Pages 111-121
  4. Test Data Compression

    1. Jin-Fu Li, Ruey-Shing Tzeng, Cheng-Wen Wu, Krishnendu Chakrabarty
      Pages 151-163
  5. Interconnect, Crosstalk and Signal Integrity

    1. Chen Li, Xiaoliang Bai, Sujit Dey, Krishnendu Chakrabarty
      Pages 165-174
    2. Mehrdad Nourani, Amir Attarha, Krishnendu Chakrabarty
      Pages 175-190
    3. Cecilia Metra, Michele Favalli, Stefano Di Francescantonio, Bruno Riccò, Krishnendu Chakrabarty
      Pages 191-200

About this book

Introduction

System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity.

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing.

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.

Keywords

Signal Standard algorithms automation data compression development integrated circuit interconnect manufacturing mechanism modeling optimization stability system on chip (SoC) testing

Editors and affiliations

  • Krishnendu Chakrabarty
    • 1
  1. 1.Duke UniversityUSA

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4757-6527-4
  • Copyright Information Springer-Verlag US 2002
  • Publisher Name Springer, Boston, MA
  • eBook Packages Springer Book Archive
  • Print ISBN 978-1-4419-5307-0
  • Online ISBN 978-1-4757-6527-4
  • Series Print ISSN 0929-1296
  • About this book