Electron Backscatter Diffraction in Materials Science

  • Adam J. Schwartz
  • Mukul Kumar
  • Brent L. Adams

Table of contents

  1. Front Matter
    Pages i-xvi
  2. Stuart I. Wright
    Pages 51-64
  3. Melik C. Demirel, Bassem S. El-Dasher, Brent L. Adams, Anthony D. Rollett
    Pages 65-74
  4. Dorte Juul Jensen
    Pages 91-104
  5. Alwyn Eades
    Pages 123-126
  6. Pierre Rolland, Keith G. Dicks
    Pages 135-140
  7. Stuart I. Wright, David P. Field, David J. Dingley
    Pages 141-152
  8. Wayne E. King, James S. Stölken, Mukul Kumar, Adam J. Schwartz
    Pages 153-170
  9. Brent L. Adams, Ben Henrie, Larry Howell, Richard Balling
    Pages 171-180
  10. Richard Becker, Hasso Weiland
    Pages 181-198
  11. David P. Field, Hasso Weiland
    Pages 199-212
  12. John F. Bingert, Thomas A. Mason, George C. Kaschner, Paul J. Maudlin, George T. Gray III
    Pages 213-229

About this book

Introduction

Electron backscatter diffraction (EBSD), when employed as an additional characterization technique to a scanning electron microscope (SEM), enables individual grain orientations, local texture, point-to-point orientation correlations, and phase identification and distributions to be determined routinely on the surfaces of bulk polycrystalline materials.  The application has experienced rapid acceptance in metallurgical, materials, and geophysical laboratories within the past decade due to the wide availability of SEMs, the ease of sample preparation from the bulk, the high speed of data acquisition, and the access to complimentary information about the microstructure on a submicron scale.

This entirely new second edition describes the complete EBSD technique, from the experimental set-up, representations of textures, and dynamical simulation, to energy-filtered, spherical, and 3-D EBSD, to phase identification, in situ experiments, strain mapping, and grain boundary networks, to the design and modeling of materials microstructures.  Numerous application examples including the analysis of deformation microstructure, dynamic deformation and damage, and EBSD studies in the earth sciences provide details of this powerful materials characterization technique.

Keywords

EBSD explained backscattered electron generation crystal deformation diffraction elastic strains electron microscopy grain boundaries materials characterization materials characterization technique materials science microscopy plastic strains;

Editors and affiliations

  • Adam J. Schwartz
    • 1
  • Mukul Kumar
    • 1
  • Brent L. Adams
    • 2
  1. 1.Lawrence Livermore National LaboratoryLivermoreUSA
  2. 2.Brigham Young UniversityProvoUSA

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4757-3205-4
  • Copyright Information Springer-Verlag US 2000
  • Publisher Name Springer, Boston, MA
  • eBook Packages Springer Book Archive
  • Print ISBN 978-1-4757-3207-8
  • Online ISBN 978-1-4757-3205-4
  • About this book