EXAFS Spectroscopy

Techniques and Applications

  • B. K. Teo
  • D. C. Joy

Table of contents

  1. Front Matter
    Pages i-viii
  2. E. A. Stern
    Pages 1-4
  3. E. A. Stern, B. Bunker, S. M. Heald
    Pages 59-79
  4. T. M. Hayes, J. B. Boyce
    Pages 81-88
  5. J. B. Boyce, T. M. Hayes
    Pages 103-125
  6. R. Ingalls, J. M. Tranquada, J. E. Whitmore, E. D. Crozier, A. J. Seary
    Pages 127-137
  7. Donald R. Sandstrom, B. Ray Stults, R. B. Greegor
    Pages 139-157
  8. G. H. Via, J. H. Sinfelt, F. W. Lytle
    Pages 159-162
  9. S. H. Hunter
    Pages 163-170
  10. Matthew Marcus
    Pages 181-184
  11. Boris W. Batterman
    Pages 197-203
  12. R. D. Leapman, L. A. Grunes, P. L. Fejes, J. Silcox
    Pages 217-239
  13. S. Csillag, D. E. Johnson, E. A. Stern
    Pages 241-254

About this book

Introduction

This book on Extended X-Ray Absorption Fine Structure (EXAFS) Spectroscopy grew out of a symposium, with the same title, organized by us at the 1979 Meeting of the Materials Research Society (MRS) in Boston, MA. That meeting provided not only an overview of the theory, instrumentation and practice of EXAFS Spectroscopy as currently employed with photon beams, but also a forum for a valuable dialogue between those using the conventional approach and those breaking fresh ground by using electron energy loss spectroscopy (EELS) for EXAFS studies. This book contains contributions from both of these groups and provides the interested reader with a detailed treatment of all aspects of EXAFS spectroscopy, from the theory, through consideration of the instrumentation for both photon and electron beam purposes, to detailed descriptions of the applications and physical limitations of these techniques. While some of the material was originally presented at the MRS meeting all of the chapters have been specially written for this book and contain much that is new and significant.

Keywords

EELS X-ray catalyst electron microscope electron microscopy energy fluorescence high pressure society sorption spectra spectroscopy structure synchrotron synchrotron radiation

Editors and affiliations

  • B. K. Teo
    • 1
  • D. C. Joy
    • 1
  1. 1.Bell LaboratoriesMurray HillUSA

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4757-1238-4
  • Copyright Information Springer-Verlag US 1981
  • Publisher Name Springer, Boston, MA
  • eBook Packages Springer Book Archive
  • Print ISBN 978-1-4757-1240-7
  • Online ISBN 978-1-4757-1238-4
  • About this book