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© 1966

Advances in X-Ray Analysis

Volume 9 Proceedings of the Fourteenth Annual Conference on Applications of X-Ray Analysis Held August 25–27, 1965

  • Editors
  • Gavin R. Mallett
  • Marie J. Fay
  • William M. Mueller
Conference proceedings

Table of contents

  1. Front Matter
    Pages i-ix
  2. F. W. Young Jr., T. O. Baldwin, A. E. Merlini, F. A. Sherrill
    Pages 1-13
  3. Mitsuru Yoshimatsu, Atsushi Shibata, Kazutake Kohra
    Pages 14-22
  4. Masataka Umeno, Hideaki Kawabe, Gunji Shinoda
    Pages 23-34
  5. Robert D. Forest, Richard J. Barton, N. C. Schieltz
    Pages 51-58
  6. Eckard Macherauch
    Pages 103-114
  7. R. P. I. Adler, H. M. Otte
    Pages 115-130
  8. R. L. Prickett, R. L. Hough
    Pages 142-151
  9. Charles P. Gazzara, R. M. Middleton
    Pages 152-158
  10. Jane Edmund Callanan, Norman O. Smith
    Pages 159-169
  11. M. Stammler, R. Bruenner, W. Schmidt, D. Orcutt
    Pages 170-189
  12. Edwin H. Shaw Jr.
    Pages 190-193
  13. Kurt F. J. Heinrich, Donald Vieth, Harvey Yakowitz
    Pages 208-220

About these proceedings

Introduction

The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. This conference, sponsored by the Metallurgy Division of the Denver Research Institute, University of Denver, was held on August 24,25, and 26, 1965, at the Albany Hotel in Denver, Colorado. Of the 56 papers presented at the conference, 46 are included in this volume; also included is an open discussion held on the effects of chemical com­ bination on X-ray spectra. The subjects presented represent a broad scope of applications of X-rays to a variety of fields and disciplines. These included such fields as electron-probe microanalysis, the effect of chemical combination on X-ray spectra, and the uses of soft and ultrasoft X-rays in emission analysis. Also included were sessions on X-ray diffraction and fluor­ escence analysis. There were several papers on special topics, including X-ray topography and X-ray absorption fine-structure analysis. William L. Baun contributed considerable effort toward the conference by organizing the session on the effect of chemical combination on X-ray spectra fine structure. A special session was established through the excellent efforts of S. P. Ong on the uses and applica­ tions of soft X-rays in fluorescent analysis. We offer our sincere thanks to these men, for these two special sessions contributed greatly to the success of the conference.

Keywords

Absorption Sorption X-ray diffraction fields metallurgy metals paper spectra structure x-ray absorption

Bibliographic information

  • Book Title Advances in X-Ray Analysis
  • Book Subtitle Volume 9 Proceedings of the Fourteenth Annual Conference on Applications of X-Ray Analysis Held August 25–27, 1965
  • Authors Gavin R. Mallett
    Marie Fay
    William M. Mueller
  • DOI https://doi.org/10.1007/978-1-4684-7633-0
  • Copyright Information Springer-Verlag US 1966
  • Publisher Name Springer, Boston, MA
  • eBook Packages Springer Book Archive
  • Hardcover ISBN 978-0-306-38109-6
  • Softcover ISBN 978-1-4684-7635-4
  • eBook ISBN 978-1-4684-7633-0
  • Edition Number 1
  • Number of Pages IX, 544
  • Number of Illustrations 194 b/w illustrations, 12 illustrations in colour
  • Topics Physical Chemistry
  • Buy this book on publisher's site