Ion Beam Surface Layer Analysis

Volume 1

  • O. Meyer
  • G. Linker
  • F. Käppeler

Table of contents

  1. Front Matter
    Pages i-xvii
  2. Energy Loss and Straggling

    1. Front Matter
      Pages 1-1
    2. J. F. Ziegler, W. K. Chu, J. S.-Y. Feng
      Pages 15-27
    3. R. A. Baragiola, J. C. Eckardt
      Pages 29-31
    4. B. M. U. Scherzer, P. Børgesen, M.-A. Nicolet, J. W. Mayer
      Pages 33-46
    5. J. Roth, R. Behrisch, W. Eckstein, B. M. U. Scherzer
      Pages 47-54
    6. B. H. Armitage, P. N. Trehan
      Pages 55-63
    7. D. Olmos, F. Aldape, J. Calvillo, A. Chi, S. Romero, J. Rickards
      Pages 65-74
    8. M. Luomajärvi, A. Fontell, M. Bister
      Pages 75-85
    9. G. Deconninck, Y. Fouilhe
      Pages 87-97
  3. Backscattering Analysis

    1. Front Matter
      Pages 109-109
    2. J. F. Ziegler, R. F. Lever, J. K. Hirvonen
      Pages 163-183
    3. H. Oetzmann, A. Feuerstein, H. Grahmann, S. Kalbitzer
      Pages 245-254
    4. J. Schou, S. Steenstrup, A. Johansen, L. T. Chadderton
      Pages 255-263
    5. C. D. Mackenzie, B. H. Armitage
      Pages 281-291
    6. G. Mezey, J. Gyulai, T. Nagy, E. Kotai, A. Manuaba
      Pages 303-312
  4. Applications of Backscattering and Combined Techniques

    1. Front Matter
      Pages 315-315
    2. P. Eichinger, H. Sauermann, M. Wahl
      Pages 353-362
    3. K. Gamo, T. Inada, I. Samid, C. P. Lee, J. W. Mayer
      Pages 375-384
    4. J. E. E. Baglin, F. M. d’Heurle
      Pages 385-395
    5. S. U. Campisano, E. Costanzo, G. Foti, E. Rimini
      Pages 397-406
    6. A. Barcz, A. Turos, L. Wieluński
      Pages 407-414
    7. J. A. Borders, G. W. Arnold
      Pages 415-424
  5. Equipment

  6. Back Matter
    Pages 495-502

About this book


The II. International Conference on Ion Beam Surface Layer Analysis was held on September 15-19, 1975 at the Nuclear Research Center, Karlsruhe, Germany. The date fell between two related con­ ferences: "Application of Ion-Beams to Materials" at Warwick, Eng­ land and "Atomic Collisions in Solids" at Amsterdam, the Nether­ lands. The first conference on Ion Beam Surface Layer Analysis was held at Yorktown Heights, New York, 1973. The major topic of that and the present conference was the material analysis with ion beams including backscattering and channeling, nuclear reactions and ion induced X-rays with emphasis on technical problems and no­ vel applications. The increasing interest in this field was docu­ mented by 7 invited papers and 85 contributions which were presen­ ted at the meeting in Karlsruhe to about 150 participants from 21 countries. The oral presentations were followed by parallel ses­ sions on "Fundamental Aspects", "Analytical Problems" and "Appli­ cations" encouraging detailed discussions on the topics of most current interest. Summaries of these sessions were presented by the discussion leaders to the whole conference. All invited and contributed papers are included in these proceedings; summaries of the discussion sessions will appear in a separate booklet and are availble from the editors. The application of ion beams to material analysis is now well established.


Cross section X-ray atomic collision collision electron heavy ion ion nuclear reaction paper reactions scattering

Editors and affiliations

  • O. Meyer
    • 1
  • G. Linker
    • 1
  • F. Käppeler
    • 1
  1. 1.Nuclear Research CenterKarlsruheGermany

Bibliographic information