Advertisement

X-Ray and Neutron Dynamical Diffraction

Theory and Applications

  • André Authier
  • Stefano Lagomarsino
  • Brian K. Tanner

Part of the NATO ASI Series book series (NSSB, volume 357)

Table of contents

  1. Front Matter
    Pages i-ix
  2. Basis of the Dynamical Theory of Diffraction

  3. Diffraction Topography

  4. X-Ray Standing Waves

    1. J. R. Patel
      Pages 211-224
    2. S. Lagomarsino
      Pages 249-258
  5. Theory and Applications of High Resolution Diffractometry

    1. Václav Holý, Petr Mikulík
      Pages 259-268
    2. Paul F. Fewster
      Pages 269-288
    3. Paul F. Fewster
      Pages 289-299
    4. Marco Servidori, Franco Cembali, Silvia Milita
      Pages 301-321
  6. Multiple-Beam Diffraction

  7. X-Ray and Neutron Interferometry

  8. Back Matter
    Pages 411-419

About this book

Introduction

This volume collects the proceedings of the 23rd International Course of Crystallography, entitled "X-ray and Neutron Dynamical Diffraction, Theory and Applications," which took place in the fascinating setting of Erice in Sicily, Italy. It was run as a NATO Advanced Studies Institute with A. Authier (France) and S. Lagomarsino (Italy) as codirectors, and L. Riva di Sanseverino and P. Spadon (Italy) as local organizers, R. Colella (USA) and B. K. Tanner (UK) being the two other members of the organizing committee. It was attended by about one hundred participants from twenty four different countries. Two basic theories may be used to describe the diffraction of radiation by crystalline matter. The first one, the so-called geometrical, or kinematical theory, is approximate and is applicable to small, highly imperfect crystals. It is used for the determination of crystal structures and describes the diffraction of powders and polycrystalline materials. The other one, the so-called dynamical theory, is applicable to perfect or nearly perfect crystals. For that reason, dynamical diffraction of X-rays and neutrons constitutes the theoretical basis of a great variety of applications such as: • the techniques used for the characterization of nearly perfect high technology materials, semiconductors, piezoelectric, electrooptic, ferroelectric, magnetic crystals, • the X-ray optical devices used in all modem applications of Synchrotron Radiation (EXAFS, High Resolution X-ray Diffractometry, magnetic and nuclear resonant scattering, topography, etc. ), and • X-ray and neutron interferometry.

Keywords

X-ray crystal crystal structure crystallography scattering semiconductor semiconductors

Editors and affiliations

  • André Authier
    • 1
  • Stefano Lagomarsino
    • 2
  • Brian K. Tanner
    • 3
  1. 1.Université Pierre et Marie CurieParisFrance
  2. 2.Istituto Elettronica Stato SolidoCNRRomeItaly
  3. 3.University of DurhamDurhamEngland

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4615-5879-8
  • Copyright Information Plenum Press, New York 1996
  • Publisher Name Springer, Boston, MA
  • eBook Packages Springer Book Archive
  • Print ISBN 978-1-4613-7696-5
  • Online ISBN 978-1-4615-5879-8
  • Series Print ISSN 0258-1221
  • Buy this book on publisher's site