© 2000

Atom Probe Tomography

Analysis at the Atomic Level


Table of contents

  1. Front Matter
    Pages i-xv
  2. M. K. Miller
    Pages 1-23
  3. M. K. Miller
    Pages 25-44
  4. M. K. Miller
    Pages 45-83
  5. M. K. Miller
    Pages 85-119
  6. M. K. Miller
    Pages 121-156
  7. M. K. Miller
    Pages 157-195
  8. Back Matter
    Pages 197-239

About this book


The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution. Therefore, atom probe tomography provides a technique for acquiring atomic resolution three­ dimensional images of the solute distribution within the microstructures of materials. This monograph is designed to provide researchers and students the necessary information to plan and experimentally conduct an atom probe tomography experiment. The techniques required to visualize and to analyze the resulting three-dimensional data are also described. The monograph is organized into chapters each covering a specific aspect of the technique. The development of this powerful microanalytical technique from the origins offield ion microscopy in 1951, through the first three-dimensional atom probe prototype built in 1986 to today's commercial state-of-the-art three­ dimensional atom probe is documented in chapter 1. A general introduction to atom probe tomography is also presented in chapter 1. The various methods to fabricate suitable needle-shaped specimens are presented in chapter 2. The procedure to form field ion images of the needle-shaped specimen is described in chapter 3. In addition, the appearance of microstructural features and the information that may be estimated from field ion microscopy are summarized. A brief account of the theoretical basis for processes of field ionization and field evaporation is also included.


Metall alloy atom probe atom probe tomography field ion microscopy metal microscopy

Authors and affiliations

  1. 1.Oak Ridge National LaboratoryOak RidgeUSA

Bibliographic information

  • Book Title Atom Probe Tomography
  • Book Subtitle Analysis at the Atomic Level
  • Authors Michael K. Miller
  • DOI
  • Copyright Information Kluwer Academic/Plenum Publishers, New York 2000
  • Publisher Name Springer, Boston, MA
  • eBook Packages Springer Book Archive
  • Hardcover ISBN 978-0-306-46415-7
  • Softcover ISBN 978-1-4613-6921-9
  • eBook ISBN 978-1-4615-4281-0
  • Edition Number 1
  • Number of Pages XV, 239
  • Number of Illustrations 0 b/w illustrations, 0 illustrations in colour
  • Topics Characterization and Evaluation of Materials
    Metallic Materials
  • Buy this book on publisher's site