Critical Assessment and Research Needs

  • Stephen M. Hsu
  • Z. Charles Ying

Table of contents

  1. Front Matter
    Pages i-xi
  2. Stephen M. Hsu, Z. Charles Ying
    Pages 1-14
  3. Jorn Larsen-Basse
    Pages 15-22
  4. William C. Tang
    Pages 23-28
  5. Judith A. Harrison, Paul T. Mikulski, Steven J. Stuart, Alan B. Tutein
    Pages 55-62
  6. H. G. E. Hentschel, I. Tovstopyat-Nelip
    Pages 63-77
  7. Min-Feng Yu, Mark J. Dyer, Rodney S. Ruoff
    Pages 109-113
  8. M. Dienwiebel, J. A. Heimberg, T. Zijlstra, E. van der Drift, D. J. Spaanderman, E. de Kuyper et al.
    Pages 115-122
  9. Michael T. Dugger
    Pages 123-137
  10. Kenneth Breuer, Frederic Ehrich, Luc Fréchette, Stuart Jacobson, C.-C. Lin, D. J. Orr et al.
    Pages 197-220

About this book


Nanotribology: Critical Assessment and Research Needs is an excellent reference for both academic and industrial researchers working in the fields of nanotechnology, tribology, mechanical engineering, materials science and engineering, MEMS, NEMS, magnetic recording, and biomedical devices. It will also be of interest to those pursuing scanning probe microscopy, nanoimaging, mesomanufacturing, sensors, actuators, aerospace, defense (controllers, microsystems), and military systems.

Nanotribology: Critical Assessment and Research Needs provides a critical assessment of the current state of the art of nanotribology within the context of MEMS, mesomanufacturing, nanotechnology and microsystems. It contains chapters written by the leading experts in these fields. It identifies gaps in current knowledge and barriers to applications, and recommends research areas that need to be addressed to enable the rapid development of technologies.


design development mechanical engineering microelectromechanical system (MEMS) microscopy modeling nanoparticle nanotechnology nanotribology

Editors and affiliations

  • Stephen M. Hsu
    • 1
  • Z. Charles Ying
    • 1
  1. 1.National Institute of Standards and TechnologyGaithersburgUSA

Bibliographic information

  • DOI
  • Copyright Information Springer Science+Business Media New York 2003
  • Publisher Name Springer, Boston, MA
  • eBook Packages Springer Book Archive
  • Print ISBN 978-1-4613-5356-0
  • Online ISBN 978-1-4615-1023-9
  • About this book