Local Electrode Atom Probe Tomography

A User's Guide

  • David J. Larson
  • Ty J. Prosa
  • Robert M. Ulfig
  • Brian P. Geiser
  • Thomas F. Kelly

Table of contents

  1. Front Matter
    Pages i-xvii
  2. David J. Larson, Ty J. Prosa, Robert M. Ulfig, Brian P. Geiser, Thomas F. Kelly
    Pages 1-23
  3. David J. Larson, Ty J. Prosa, Robert M. Ulfig, Brian P. Geiser, Thomas F. Kelly
    Pages 25-53
  4. David J. Larson, Ty J. Prosa, Robert M. Ulfig, Brian P. Geiser, Thomas F. Kelly
    Pages 55-77
  5. David J. Larson, Ty J. Prosa, Robert M. Ulfig, Brian P. Geiser, Thomas F. Kelly
    Pages 79-108
  6. David J. Larson, Ty J. Prosa, Robert M. Ulfig, Brian P. Geiser, Thomas F. Kelly
    Pages 109-162
  7. David J. Larson, Ty J. Prosa, Robert M. Ulfig, Brian P. Geiser, Thomas F. Kelly
    Pages 163-199
  8. David J. Larson, Ty J. Prosa, Robert M. Ulfig, Brian P. Geiser, Thomas F. Kelly
    Pages 201-247
  9. Back Matter
    Pages 249-318

About this book

Introduction

This book is the first, single-source guide to successful experiments using the local electrode atom probe (LEAP®) microscope. Coverage is both comprehensive and user friendly, including the fundamentals of preparing specimens for the microscope from a variety of materials, the details of the instrumentation used in data collection, the parameters under which optimal data are collected, the current methods of data reconstruction, and selected methods of data analysis. Tricks of the trade are described that are often learned only through trial and error, allowing users to succeed much more quickly in the challenging areas of specimen preparation and data collection. A closing chapter on applications presents selected, state-of-the-art results using the LEAP microscope.

  • Written from the user perspective by the developers of the instrument themselves
  • Covers the main features of a local electrode atom probe tomography experiment from start to finish
  • Contains practical hints and  tutorial information that is useful to any atom probe operator to improve the chances of a  successful analysis
  • Includes a chapter on hardware/instrumentation, which explains to the novice user the various parts of the instrument and how they operate
  • Provides an overview of the software methods employed in LEAP, including reconstruction and data analysis

Keywords

APT APT, history of Atom probe tomography Concentration space analyses Field evaporation LEAP LEAP Specimen Preparation LEAP User’s guide LEAP analysis LEAP applications LEAP ceramic and geological materials LEAP composite structures LEAP data collection LEAP data processing LEAP data reconstruction LEAP design LEAP instrumentation LEAP organic and biological materials LEAP semiconductor materials LEAP tomography LEAP tomography book LEAP, catalytic materials LEAP, history of LEAP, metals Local electrode atom probe Local electrode atom probe tomography how-to Local electrode atom probe tomograpy Mass spectral performance Reconstruction geometry Solute analysis Spatial distribution maps Spectral analysis Tomography how-to book Tomography specimen preparation Tomography tips book

Authors and affiliations

  • David J. Larson
    • 1
  • Ty J. Prosa
    • 2
  • Robert M. Ulfig
    • 3
  • Brian P. Geiser
    • 4
  • Thomas F. Kelly
    • 5
  1. 1.Cameca Instruments, Inc.MadisonUSA
  2. 2.CAMECA Instruments, Inc.MadisonUSA
  3. 3.CAMECA Instruments, Inc.MadisonUSA
  4. 4.CAMECA Instruments, Inc.MadisonUSA
  5. 5.Cameca Instruments, Inc.MadisonUSA

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4614-8721-0
  • Copyright Information Springer Science+Business Media New York 2013
  • Publisher Name Springer, New York, NY
  • eBook Packages Chemistry and Materials Science
  • Print ISBN 978-1-4614-8720-3
  • Online ISBN 978-1-4614-8721-0
  • About this book