Stress-Induced Mutagenesis

  • David Mittelman

Table of contents

  1. Front Matter
    Pages i-xv
  2. Chandan Shee, P. J. Hastings, Susan M. Rosenberg
    Pages 21-39
  3. Eduardo Robleto, Holly A. Martin, Carmen Vallin, Mario Pedraza-Reyes, Ronald Yasbin
    Pages 41-57
  4. Zhongge Zhang, Jing Wang, Maksim A. Shlykov, Milton H. Saier Jr.
    Pages 59-77
  5. Xiangyi Lu, Luan Wang, Vincent E. Sollars, Mark D. Garfinkel, Douglas M. Ruden
    Pages 79-101
  6. Nimrat Chatterjee, Beatriz A. Santillan, John H. Wilson
    Pages 119-150
  7. Susan E. Scanlon, Peter M. Glazer
    Pages 151-181
  8. Christopher P. Allen, Akira Fujimori, Ryuichi Okayasu, Jac A. Nickoloff
    Pages 183-198
  9. Carmel Mothersill, Colin Seymour
    Pages 199-222
  10. Subhajyoti De, R. Matthew Ward
    Pages 257-270
  11. Back Matter
    Pages 271-275

About this book

Introduction

The discoveries of stress-induced mutation and epigenetic inheritance have challenged the claim of independence between the evolutionary forces of mutation and selection. In “Stress-Induced Mutagenesis”, leading experts provide the key evidence for and the molecular details of stress-induced genetic and epigenetic mutation, integrating cross-disciplinary observations from a number of species and biological systems, including human. The observations have vast implications for evolutionary biology but also for human medicine. A comprehensive understanding of stress-induced mutagenesis and the processes underlying evolvability, will enable gains in the treatment and management of cancer, as well as other human disorders that result from damaged or unstable genomes.

Editors and affiliations

  • David Mittelman
    • 1
  1. 1., Department of Biological SciencesVirginia TechBlacksburgUSA

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4614-6280-4
  • Copyright Information Springer Science+Business Media New York 2013
  • Publisher Name Springer, New York, NY
  • eBook Packages Biomedical and Life Sciences
  • Print ISBN 978-1-4614-6279-8
  • Online ISBN 978-1-4614-6280-4
  • About this book