Analog IC Reliability in Nanometer CMOS

  • Elie Maricau
  • Georges Gielen

Part of the Analog Circuits and Signal Processing book series (ACSP)

Table of contents

  1. Front Matter
    Pages i-xvi
  2. Elie Maricau, Georges Gielen
    Pages 1-14
  3. Elie Maricau, Georges Gielen
    Pages 15-35
  4. Elie Maricau, Georges Gielen
    Pages 37-77
  5. Elie Maricau, Georges Gielen
    Pages 79-91
  6. Elie Maricau, Georges Gielen
    Pages 93-149
  7. Elie Maricau, Georges Gielen
    Pages 151-180
  8. Elie Maricau, Georges Gielen
    Pages 181-183
  9. Back Matter
    Pages 185-198

About this book

Introduction

This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed.

 

The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.

 

·         Enables readers to understand long-term reliability of an integrated circuit;

·         Reviews CMOS unreliability effects, with focus on those that will emerge in future CMOS nodes;

·         Provides overview of models for key aging effects, as well as compact models that can be included in a circuit simulator, with model parameters for advanced CMOS technology;

·         Describes existing reliability simulators, along with techniques to analyze the impact of process variations and aging on an arbitrary analog circuit.

Keywords

Analog Circuits and Signal Processing Analog Integrated Circuits Failure-resilient Analog Circuit Design Reliability in Analog Integrated Circuits Reliability in Nanometer CMOS Transistor Aging Effects on Circuit Reliability

Authors and affiliations

  • Elie Maricau
    • 1
  • Georges Gielen
    • 2
  1. 1., ESAT-MICASKU LeuvenHeverleeBelgium
  2. 2., ESAT-MICASKU LeuvenHeverleeBelgium

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4614-6163-0
  • Copyright Information Springer Science+Business Media New York 2013
  • Publisher Name Springer, New York, NY
  • eBook Packages Engineering
  • Print ISBN 978-1-4614-6162-3
  • Online ISBN 978-1-4614-6163-0
  • About this book