MEMS and Nanotechnology, Volume 6

Proceedings of the 2012 Annual Conference on Experimental and Applied Mechanics

  • Gordon A. Shaw
  • Barton C. Prorok
  • LaVern A. Starman
Conference proceedings

DOI: 10.1007/978-1-4614-4436-7

Part of the Conference Proceedings of the Society for Experimental Mechanics Series book series (CPSEMS)

Table of contents

  1. Front Matter
    Pages i-viii
  2. R. P. Weisenberger, R. A. Coutu Jr., LaVern A. Starman
    Pages 1-9
  3. Sithara S. Wijeratne, Nolan C. Harris, Ching-Hwa Kiang
    Pages 19-23
  4. Gavin M. King, Allison B. Churnside, Thomas T. Perkins
    Pages 31-36
  5. Kevin Schwieker, James Frye, Barton C. Prorok
    Pages 41-46
  6. Jennifer Hay, Verena Maier, Karsten Durst, Mathias Göken
    Pages 47-52
  7. David B. Blocher, Alan T. Zehnder, Richard H. Rand
    Pages 53-58
  8. Ling Wu, Jean-Claude Golinval, Ludovic Noels
    Pages 67-74
  9. Sriharsha V. Aradhya, Michael Frei, Mark S. Hybertsen, Latha Venkataraman
    Pages 75-84
  10. Nathan E. Glauvitz, Ronald A. Coutu Jr., Peter J. Collins, LaVern A. Starman
    Pages 93-99
  11. Benjamin Klusemann, Alain Franz Knorr, Horst Vehoff, Bob Svendsen
    Pages 101-110
  12. Paresh S. Ghangrekar, H. Murthy, Balkrishna C. Rao
    Pages 111-118
  13. Ying Chen, Mario Walter, Oliver Kraft
    Pages 119-124
  14. Corey Rutledge, Michael Thyden, Cosme Furlong, John J. Rosowski, Jeffery Tao Cheng
    Pages 125-129
  15. Everett Tripp, Frank Pantuso, Lei Zhang, Ellery Harrington, Cosme Furlong
    Pages 131-134

About these proceedings

Introduction

MEMS and Nanotechnology, Volume 6: Proceedings of the 2012 Annual Conference on Experimental and Applied Mechanics, the sixth volume of seven from the Conference, brings together 23 contributions to this important area of research and engineering.  The collection presents early findings and case studies on fundamental and applied aspects of Experimental and Applied Mechanics, including papers on: 

  • Devices & Fabrication
  • Measurement Challenges in Single Molecule/Single Atom Mechanical Testing
  • Nanoindentation
  • Size Effects in Metals
  • Optical Methods
  • Reliability, Residual Stress & Tribology

Keywords

Devices & Fabrication Measurement Challenges Nanoindentation Optical Methods Residual Stress Single Molecule/Single Atom Mechanical Testing Size Effects in Metals Tribology

Editors and affiliations

  • Gordon A. Shaw
    • 1
  • Barton C. Prorok
    • 2
  • LaVern A. Starman
    • 3
  1. 1.NISTGaithersburgUSA
  2. 2.Auburn UniversityAuburnUSA
  3. 3.Wright Patterson Air Force BaseUSA

Bibliographic information

  • Copyright Information The Society for Experimental Mechanics, Inc. 2013
  • Publisher Name Springer, New York, NY
  • eBook Packages Engineering
  • Print ISBN 978-1-4614-4435-0
  • Online ISBN 978-1-4614-4436-7
  • Series Print ISSN 2191-5644
  • Series Online ISSN 2191-5652