MEMS and Nanotechnology, Volume 6

Proceedings of the 2012 Annual Conference on Experimental and Applied Mechanics

  • Gordon A. Shaw
  • Barton C. Prorok
  • LaVern A. Starman
Conference proceedings

Part of the Conference Proceedings of the Society for Experimental Mechanics Series book series (CPSEMS)

Table of contents

  1. Front Matter
    Pages i-viii
    PDF
  2. Silicon Carbide High Temperature MEMS Capacitive Strain Sensor
    R. P. Weisenberger, R. A. Coutu Jr., LaVern A. Starman
    Pages 1-9
  3. Characterizing External Resistive, Inductive and Capacitive Loads for Micro-Switches
    Benjamin Toler, Ronald Coutu Jr.
    Pages 11-18
  4. Principles Involved in Interpreting Single-Molecule Force Measurement of Biomolecules
    Sithara S. Wijeratne, Nolan C. Harris, Ching-Hwa Kiang
    Pages 19-23
  5. Measurement of the Gold-Gold Bond Rupture Force at 4 K in a Single-Atom Chain Using Photon-Momentum-Based Force Calibration
    Douglas T. Smith, J. R. Pratt
    Pages 25-29
  6. A Precision Force Microscope for Biophysics
    Gavin M. King, Allison B. Churnside, Thomas T. Perkins
    Pages 31-36
  7. Hydrodynamic Force Compensation for Single-Molecule Mechanical Testing Using Colloidal Probe Atomic Force Microscopy
    Gordon A. Shaw
    Pages 37-40
  8. New Insight into Pile-Up in Thin Film Indentation
    Kevin Schwieker, James Frye, Barton C. Prorok
    Pages 41-46
  9. Strain-Rate Sensitivity (SRS) of Nickel by Instrumented Indentation
    Jennifer Hay, Verena Maier, Karsten Durst, Mathias Göken
    Pages 47-52
  10. Frequency Multiplication and Demultiplication in MEMS
    David B. Blocher, Alan T. Zehnder, Richard H. Rand
    Pages 53-58
  11. Characterizing Metal Insulator Transition (MIT) Materials for Use as Micro-Switch Elements
    Brent L. Danner, Ronald A. Coutu Jr.
    Pages 59-66
  12. Stiction Failure in Microswitches Due to Elasto-Plastic Adhesive Contacts
    Ling Wu, Jean-Claude Golinval, Ludovic Noels
    Pages 67-74
  13. Simultaneous Measurement of Force and Conductance Across Single Molecule Junctions
    Sriharsha V. Aradhya, Michael Frei, Mark S. Hybertsen, Latha Venkataraman
    Pages 75-84
  14. High Speed Magnetic Tweezers at 10,000fps with Reflected Hg-Lamp Illumination
    Bob M. Lansdorp, Omar A. Saleh
    Pages 85-91
  15. Etching Silicon Dioxide for CNT Field Emission Device
    Nathan E. Glauvitz, Ronald A. Coutu Jr., Peter J. Collins, LaVern A. Starman
    Pages 93-99
  16. Modeling of Sheet Metals with Coarse Texture via Crystal Plasticity
    Benjamin Klusemann, Alain Franz Knorr, Horst Vehoff, Bob Svendsen
    Pages 101-110
  17. Evaluation of Mechanical Properties of Nano-structured Al6061 Synthesized Using Machining
    Paresh S. Ghangrekar, H. Murthy, Balkrishna C. Rao
    Pages 111-118
  18. Hardening Behaviour of Thin Wires Under Loading with Strain Gradients
    Ying Chen, Mario Walter, Oliver Kraft
    Pages 119-124
  19. Mapping the Histology of the Human Tympanic Membrane by Spatial Domain Optical Coherence Tomography
    Corey Rutledge, Michael Thyden, Cosme Furlong, John J. Rosowski, Jeffery Tao Cheng
    Pages 125-129
  20. Opto-Mechanical Characterization of a MEMS Sensor for Real-Time Infrared Imaging
    Everett Tripp, Frank Pantuso, Lei Zhang, Ellery Harrington, Cosme Furlong
    Pages 131-134

About these proceedings

Introduction

MEMS and Nanotechnology, Volume 6: Proceedings of the 2012 Annual Conference on Experimental and Applied Mechanics, the sixth volume of seven from the Conference, brings together 23 contributions to this important area of research and engineering.  The collection presents early findings and case studies on fundamental and applied aspects of Experimental and Applied Mechanics, including papers on: 

  • Devices & Fabrication
  • Measurement Challenges in Single Molecule/Single Atom Mechanical Testing
  • Nanoindentation
  • Size Effects in Metals
  • Optical Methods
  • Reliability, Residual Stress & Tribology

Keywords

Devices & Fabrication Measurement Challenges Nanoindentation Optical Methods Residual Stress Single Molecule/Single Atom Mechanical Testing Size Effects in Metals Tribology

Editors and affiliations

  • Gordon A. Shaw
    • 1
  • Barton C. Prorok
    • 2
  • LaVern A. Starman
    • 3
  1. 1.NISTGaithersburgUSA
  2. 2.Auburn UniversityAuburnUSA
  3. 3.Wright Patterson Air Force BaseUSA

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4614-4436-7
  • Copyright Information The Society for Experimental Mechanics, Inc. 2013
  • Publisher Name Springer, New York, NY
  • eBook Packages Engineering
  • Print ISBN 978-1-4614-4435-0
  • Online ISBN 978-1-4614-4436-7
  • Series Print ISSN 2191-5644
  • Series Online ISSN 2191-5652
  • Buy this book on publisher's site