Atom Probe Microscopy

  • Baptiste Gault
  • Michael P. Moody
  • Julie M. Cairney
  • Simon P. Ringer

Part of the Springer Series in Materials Science book series (SSMATERIALS, volume 160)

Table of contents

  1. Front Matter
    Pages i-xxiii
  2. Fundamentals

    1. Front Matter
      Pages 1-1
    2. Baptiste Gault, Michael P. Moody, Julie M. Cairney, Simon P. Ringer
      Pages 3-7
    3. Baptiste Gault, Michael P. Moody, Julie M. Cairney, Simon P. Ringer
      Pages 9-28
    4. Baptiste Gault, Michael P. Moody, Julie M. Cairney, Simon P. Ringer
      Pages 29-68
  3. Practical Aspects

    1. Front Matter
      Pages 69-69
    2. Baptiste Gault, Michael P. Moody, Julie M. Cairney, Simon P. Ringer
      Pages 71-110
    3. Baptiste Gault, Michael P. Moody, Julie M. Cairney, Simon P. Ringer
      Pages 111-120
    4. Baptiste Gault, Michael P. Moody, Julie M. Cairney, Simon P. Ringer
      Pages 121-155
    5. Baptiste Gault, Michael P. Moody, Julie M. Cairney, Simon P. Ringer
      Pages 157-209
  4. Applying Atom Probe Techniques for Materials Science

    1. Front Matter
      Pages 211-211
    2. Baptiste Gault, Michael P. Moody, Julie M. Cairney, Simon P. Ringer
      Pages 213-297
    3. Baptiste Gault, Michael P. Moody, Julie M. Cairney, Simon P. Ringer
      Pages 299-311
    4. Baptiste Gault, Michael P. Moody, Julie M. Cairney, Simon P. Ringer
      Pages 313-385
  5. Back Matter
    Pages 387-396

About this book

Introduction

Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument’s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.


Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.

  • Provides the most practical, up-to-date and critical review of  atom probe microscopy techniques
  • Presents a detailed description of the analysis tools
  • Includes practical examples of how the technique can be used in materials science research
  • Stands as a must-have reference for any user of atom probe microscopy

Keywords

Atom probe data analysis Atom probe data quality Atom probe microscopy book Atom probe microscopy materials science Atom probe microscopy specimen preparation Atom probe tomography Experimental protocols, atom probe microscopy Field desorption Field evaporation Field ion microscopy Tomographic reconstruction

Authors and affiliations

  • Baptiste Gault
    • 1
  • Michael P. Moody
    • 2
  • Julie M. Cairney
    • 3
  • Simon P. Ringer
    • 4
  1. 1., Dept of Materials Science & EngineeringMcMaster UniversityHamiltonCanada
  2. 2., Department of MaterialsUniversity of OxfordOxfordUnited Kingdom
  3. 3., Australian Centre for Microscopy and MicThe University of SydneySydneyAustralia
  4. 4., Australian Centre for Microscopy andUniversity of SydneySydneyAustralia

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4614-3436-8
  • Copyright Information Springer Science+Business Media, LLC 2012
  • Publisher Name Springer, New York, NY
  • eBook Packages Chemistry and Materials Science
  • Print ISBN 978-1-4614-3435-1
  • Online ISBN 978-1-4614-3436-8
  • Series Print ISSN 0933-033X
  • Series Online ISSN 2196-2812
  • About this book