Predictive Technology Model for Robust Nanoelectronic Design

  • Yu Cao

Part of the Integrated Circuits and Systems book series (ICIR)

Table of contents

About this book

Introduction

Predictive Technology Model for Robust Nanoelectronic Design explains many of the technical mysteries behind the Predictive Technology Model (PTM) that has been adopted worldwide in explorative design research. Through physical derivation and technology extrapolation, PTM is the de-factor device model used in electronic design. This work explains the systematic model development and provides a guide to robust design practice in the presence of variability and reliability issues. Having interacted with multiple leading semiconductor companies and university research teams, the author brings a state-of-the-art perspective on technology scaling to this work and shares insights gained in the practices of device modeling.

Keywords

Circuit performance analysis Device and circuit reliability Device modeling Electronic design automation Low power design Nanoelectronic design Predictive modeling Process variability Technology scaling

Authors and affiliations

  • Yu Cao
    • 1
  1. 1., School of ECEEArizona State UniversityTempeUSA

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4614-0445-3
  • Copyright Information Springer Science+Business Media, LLC 2011
  • Publisher Name Springer, Boston, MA
  • eBook Packages Engineering
  • Print ISBN 978-1-4614-0444-6
  • Online ISBN 978-1-4614-0445-3
  • Series Print ISSN 1558-9412
  • About this book