Advances in X-Ray Analysis

1. Rapid Analysis of Mn in Plain Carbon Steels by Nondispersive X-Ray Fluorescence Spectroscopy

   • R. J. Gehrke, M. S. Cole, W. A. Ryder

   Pages 276-284

2. The Use of Field Emission Tubes in X-Ray Analysis

   • J. H. McCrary, Ted Van Vorous

   Pages 285-294

3. Old Errors and New Corrections in X-Ray Line Profile Analysis

   • A. Kidron, R. J. De Angelis

   Pages 295-306

4. The Effects of Self-Irradiation on the Lattice of 238(80%)PuO2

   • R. B. Roof Jr.

   Pages 307-318

5. The Disorder-Order Transformation in Ni4Mo

   • Fu-Wen Ling, E. A. Starke Jr.

   Pages 319-329

6. A Strategy for Rapid and Accurate (p.p.m.) Measurement of Lattice Parameters of Single Crystals by Bond’s Method

   • R. L. Barns

   Pages 330-338

7. X-Ray Spectral Distributions from Thick Tungsten Targets in the Energy Range 12 to 300 kV

   • Ellery Storm, Harvey I. Israel, Douglas W. Lier

   Pages 339-351

8. Elemental X-Ray Cross Sections at Selected Wavelengths

   • Bobby L. Bracewell, William J. Veigele

   Pages 352-364

9. A Computerized Technique of Plotting a Complete Pole Figure by an X-Ray Reflection Method

   • J. J. Klappholz, S. Waxman, C. Feng

   Pages 365-372

10. Proton-Induced X-Ray Emission Spectroscopy in Elemental Trace Analysis

    • T. B. Johansson, R. Akselsson, S. A. E. Johansson

    Pages 373-387

11. Use of a Solid-State Detector for the Analysis of X-Rays Excited in Silicate Rocks by Alpha-Particle Bombardment

    • Ernest J. Franzgrote

    Pages 388-406

12. Studies of X Rays Induced by Charged Particles

    • Jerome L. Duggan, William L. Beck, Larry Albrecht, Lee Munz, James D. Spaulding

    Pages 407-423

13. Evaluation of X-Ray Image Intensifiers as Detectors for X-Ray Astronomy

    • W. S. Andrus, L. P. VanSpeybroeck, E. M. Kellogg, H. Gursky

    Pages 424-434

14. An Electro-Optical X-Ray Diffraction System for Grain Boundary Migration Measurements at Temperature

    • Robert E. Green Jr.

    Pages 435-445

15. Proposed Flash X-Ray System for X-Ray Diffraction with Submicrosecond Exposure Time

    • Francis M. Charbonnier

    Pages 446-461

16. Analysis of Solid Surfaces by Soft X-Ray Appearance Potential Spectroscopy

    • Robert L. Park, J. E. Houston

    Pages 462-469

17. Detector Background and Sensitivity of Semiconductor X-Ray Fluorescence Spectrometers

    • F. S. Goulding, J. M. Jaklevic, B. V. Jarrett, D. A. Landis

    Pages 470-482

18. The Measurement of Surface-Layer Stresses in a Polycrystalline Glass by Means of X-Ray Diffraction

    • E. W. Kammer, C. L. Vold

    Pages 483-488

19. The Determination of the Axis of Lattice Rotation with Respect to a Change in Texture

    • C. Feng

    Pages 489-498

20. Simultaneous Spiral Recording of Pole Figures on Polaroid Film for Texture Goniometers

    • H. Ebel, M. F. Ebel

    Pages 499-503

The application of solid-state detectors of high energy resolution to x-ray spectrometry, and the increasing use of compu­ ters in both measurement and data evaluation, are giving a new stimulus to x-ray techniques in analytical chemistry. The Twentieth Annual Denver X-ray Conference reflects this renewed interest in several ways. The invited papers, grouped in Session I, review the charac­ teristics of the detectors used in the measurement of x-rays. One paper is dedicated to the detection of single ions. Although such a subject may appear to be marginal to the purposes of the Denver Conference, we must recognize the affinity of techniques applied to similar purposes. Ion probe mass spectrometry is dedicated to tasks similar to those performed by x-ray spectrometry with the electron probe microanalyzer. Scientists and technologists will see these two techniques discussed in the same meetings. The discussion of automation and programming is not limited to the two invited speakers, but extends to papers presented in more than one session. The matter of fluorescence analysis by isotope- and tube-excitation will also be of great interest to those concerned with the practical applications of x-ray techniques. The communications contained in this volume, and the lively discussions which frequently followed the presentation of papers, attest to the vitality of the subjects which are the concern of the Annual Denver X-ray Conference.

• Migration
• Silicat
• X-ray
• Zirconium
• analytical chemistry
• crystal
• diffraction
• electron
• fluorescence
• fluorescence spectroscopy
• isotope
• lattice parameter
• quantitative analysis
• spectrometry
• spectroscopy

• National Bureau of Standards, USA

  Kurt F. J. Heinrich

• Denver Research Institute, The University of Denver, Denver, USA

  Charles S. Barrett, John B. Newkirk, Clayton O. Ruud

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