Residual Currents and Long-term Transport

  • R. T. Cheng

Part of the Coastal and Estuarine Studies book series (COASTAL, volume 38)

Table of contents

  1. Front Matter
    Pages I-XI
  2. Introduction

    1. Front Matter
      Pages 1-1
    2. Ralph T. Cheng
      Pages 3-6
  3. Residual Currents

  4. Salt Mixing and Transport

    1. Front Matter
      Pages 135-135
    2. R. J. Uncles, J. A. Stephens
      Pages 137-150
    3. Eric Wolanski, Peter Ridd
      Pages 165-183
    4. William J. Wiseman Jr., E. M. Swenson, F. J. Kelly
      Pages 184-193
    5. H. Ridderinkhof, J. T. F. Zimmerman
      Pages 194-209
    6. Richard P. Signell, W. Rockwell Geyer
      Pages 210-222

About this book

Introduction

Estuaries, bays and contiguous coastal seas are the world's most valuable, and yet most vulnerable marine ecosystems. Fundamental to the protection and management of these important resources is an understand- ing of the physical processes involved which affect the circulation, mixing, and transport of salt, nutrients and sediment. Residual Currents and Long-Term Transport processes appear to have direct control over freshwater inflows, contaminant loadings, dispersion and transport of sediments and nutrients, and causes of declining living resources. This volume provides a comprehensive and up-to-date summary of the research results on these processes in estuaries and bays. Contributions from ten countries include results based on theoretical formulations, analyses of field data, numerical models and case studies.

Keywords

Coast ecosystem evolution marine modelling ocean sediment sedimentation wind

Editors and affiliations

  • R. T. Cheng
    • 1
  1. 1.Water Resources DivisionU.S. Geological SurveyMenlo ParkUSA

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4613-9061-9
  • Copyright Information Springer-Verlag New York 1990
  • Publisher Name Springer, New York, NY
  • eBook Packages Springer Book Archive
  • Print ISBN 978-1-4613-9063-3
  • Online ISBN 978-1-4613-9061-9
  • Series Print ISSN 0724-5890
  • About this book