Characterization of Solid Surfaces

  • Philip F. Kane
  • Graydon B. Larrabee

Table of contents

  1. Front Matter
    Pages i-xviii
  2. Introduction

    1. Philip F. Kane, Graydon B. Larrabee
      Pages 1-5
  3. Physical Characteristics

    1. Front Matter
      Pages 7-7
    2. Walter C. McCrone
      Pages 9-32
    3. A. C. Hall
      Pages 33-48
    4. David John Whitehouse
      Pages 49-74
    5. Campbell Laird
      Pages 75-106
    6. Om Johari, A. V. Samudra
      Pages 107-131
    7. Philip F. Kane
      Pages 133-146
    8. Robert D. Dobrott
      Pages 147-178
  4. Chemical Characterization

    1. Front Matter
      Pages 179-179
    2. D. M. MacArthur
      Pages 181-201
    3. J. L. Seeley, R. K. Skogerboe
      Pages 203-214
    4. N. J. Harrick, K. H. Beckmann
      Pages 215-245
    5. Joseph A. Keenan, Graydon B. Larrabee
      Pages 247-273
    6. John V. Gilfrich
      Pages 275-306
    7. Shirley H. Hercules, David M. Hercules
      Pages 307-336
    8. D. Haneman
      Pages 337-377
    9. Melvin C. Hobson Jr.
      Pages 379-401
    10. W. D. Mackintosh
      Pages 403-418
    11. T. B. Pierce
      Pages 419-439
    12. Gudrun A. Hutchins
      Pages 441-484
    13. William L. Baun
      Pages 485-507
    14. Chuan C. Chang
      Pages 509-575
    15. J. M. McCrea
      Pages 577-626
    16. Daniel V. McCaughan, R. A. Kushner
      Pages 627-640
    17. C. W. White, D. L. Simms, N. H. Tolk
      Pages 641-662
  5. Back Matter
    Pages 663-670

About this book


Until comparatively recently, trace analysis techniques were in general directed toward the determination of impurities in bulk materials. Methods were developed for very high relative sensitivity, and the values determined were average values. Sampling procedures were devised which eliminated the so-called sampling error. However, in the last decade or so, a number of developments have shown that, for many purposes, the distribution of defects within a material can confer important new properties on the material. Perhaps the most striking example of this is given by semiconductors; a whole new industry has emerged in barely twenty years based entirely on the controlled distribu­ tion of defects within what a few years before would have been regarded as a pure, homogeneous crystal. Other examples exist in biochemistry, metallurgy, polyiners and, of course, catalysis. In addition to this of the importance of distribution, there has also been a recognition growing awareness that physical defects are as important as chemical defects. (We are, of course, using the word defect to imply some dis­ continuity in the material, and not in any derogatory sense. ) This broadening of the field of interest led the Materials Advisory Board( I} to recommend a new definition for the discipline, "Materials Character­ ization," to encompass this wider concept of the determination of the structure and composition of materials. In characterizing a material, perhaps the most important special area of interest is the surface.


biochemistry catalysis chemistry crystal development distribution metallurgy semiconductor structure

Editors and affiliations

  • Philip F. Kane
    • 1
  • Graydon B. Larrabee
    • 1
  1. 1.Materials Characterization LaboratoryTexas Instruments IncorporatedDallasUSA

Bibliographic information

  • DOI
  • Copyright Information Springer Science+Business Media New York 1974
  • Publisher Name Springer, Boston, MA
  • eBook Packages Springer Book Archive
  • Print ISBN 978-1-4613-4492-6
  • Online ISBN 978-1-4613-4490-2
  • Buy this book on publisher's site