VUV and Soft X-Ray Photoionization

  • Uwe Becker
  • David A. Shirley

Part of the Physics of Atoms and Molecules book series (PAMO)

Table of contents

  1. Front Matter
    Pages i-xvi
  2. M. Ya. Amusia
    Pages 1-45
  3. Jochen Schirmer, Matthew Braunstein, Mu-Tao Lee, Vincent McKoy
    Pages 105-133
  4. U. Becker, D. A. Shirley
    Pages 135-180
  5. M. O. Krause, C. D. Caldwell
    Pages 181-219
  6. J. Berkowitz, E. Rühl, H. BaumgÄrtel
    Pages 221-261
  7. J. Berkowitz
    Pages 263-289
  8. Irène Nenner, Paul Morin
    Pages 291-354
  9. G. C. King, K.-H. Schartner
    Pages 355-400
  10. H. Aksela, S. Aksela, N. Kabachnik
    Pages 401-440
  11. T. Hayaishi, P. Zimmerman
    Pages 465-494
  12. J. H. D. Eland, V. Schmidt
    Pages 495-520
  13. U. Heinzmann, N. A. Cherepkov
    Pages 521-559
  14. F. J. Wuilleumier, J. B. West
    Pages 561-605
  15. G. Schönhense, J. Hormes
    Pages 607-652
  16. Back Matter
    Pages 653-670

About this book

Introduction

Leading investigators offer the first comprehensive study of gas phase photoionization research in the VUV and soft X-ray regime since the massive employment of synchrotron radiation as a spectroscopic tool. Chapters cover all aspects of photoionization phenomena from total cross sections to highly differentiated measurements such as coincidence experiments and spin-resolved electron spectroscopy. This work is abundant with illustrations.

Keywords

Cross section Dichroism X-ray distribution electron spectroscopy excited atoms experiment illustration molecule phase polarization recombination spectrometry spectroscopy spin

Editors and affiliations

  • Uwe Becker
    • 1
  • David A. Shirley
    • 2
  1. 1.Fritz-Haber Institute of the Max Planck SocietyBerlinGermany
  2. 2.Pennsylvania State UniversityUniversity ParkUSA

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4613-0315-2
  • Copyright Information Springer-Verlag US 1996
  • Publisher Name Springer, Boston, MA
  • eBook Packages Springer Book Archive
  • Print ISBN 978-1-4613-7993-5
  • Online ISBN 978-1-4613-0315-2
  • About this book