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Scan Statistics and Applications

  • Joseph Glaz
  • N. Balakrishnan

Part of the Statistics for Industry and Technology book series (SIT)

Table of contents

  1. Front Matter
    Pages i-xxi
  2. Introduction and Preliminaries

    1. Front Matter
      Pages 1-1
    2. Joseph Glaz, N. Balakrishnan
      Pages 3-24
  3. Discrete Scan Statistics

    1. Front Matter
      Pages 25-25
    2. Joachim Krauth
      Pages 67-96
    3. Joseph I. Naus
      Pages 97-109
  4. Continuous Scan Statistics

  5. Applications

    1. Front Matter
      Pages 249-249
    2. Markos V. Koutras, N. Balakrishnan
      Pages 251-267
    3. Ming-Ying Leung, Traci E. Yamashita
      Pages 269-286
  6. Back Matter
    Pages 323-324

About this book

Introduction

The study of scan statistics and their applications to many different scientific and engineering problems have received considerable attention in the literature recently. In addition to challenging theoretical problems, the area of scan statis­ tics has also found exciting applications in diverse disciplines such as archaeol­ ogy, astronomy, epidemiology, geography, material science, molecular biology, reconnaissance, reliability and quality control, sociology, and telecommunica­ tion. This will be clearly evident when one goes through this volume. In this volume, we have brought together a collection of experts working in this area of research in order to review some of the developments that have taken place over the years and also to present their new works and point out some open problems. With this in mind, we selected authors for this volume with some having theoretical interests and others being primarily concerned with applications of scan statistics. Our sincere hope is that this volume will thus provide a comprehensive survey of all the developments in this area of research and hence will serve as a valuable source as well as reference for theoreticians and applied researchers. Graduate students interested in this area will find this volume to be particularly useful as it points out many open challenging problems that they could pursue. This volume will also be appropriate for teaching a graduate-level special course on this topic.

Keywords

Approximation DNA sequence approach Markov Monte Carlo simulation calculus continuous scan statistics discrete scan statistics finite Markov chain imbedding model observed cluster of events order statistics probability models spatial scan stat

Editors and affiliations

  • Joseph Glaz
    • 1
  • N. Balakrishnan
    • 2
  1. 1.Department of StatisticsUniversity of Connecticut at StorrsStorrsUSA
  2. 2.Department of Mathematics and StatisticsMcMaster UniversityHamiltonCanada

Bibliographic information