Information Modeling for Interoperable Dimensional Metrology

  • Yaoyao (Fiona) Zhao
  • Robert Brown
  • Thomas R. Kramer
  • Xun Xu

Table of contents

  1. Front Matter
    Pages i-xix
  2. Yaoyao (Fiona) Zhao, Robert Brown, Thomas R. Kramer, Xun Xu
    Pages 1-19
  3. Yaoyao (Fiona) Zhao, Robert Brown, Thomas R. Kramer, Xun Xu
    Pages 21-52
  4. Yaoyao (Fiona) Zhao, Robert Brown, Thomas R. Kramer, Xun Xu
    Pages 53-118
  5. Yaoyao (Fiona) Zhao, Robert Brown, Thomas R. Kramer, Xun Xu
    Pages 119-164
  6. Yaoyao (Fiona) Zhao, Robert Brown, Thomas R. Kramer, Xun Xu
    Pages 165-207
  7. Yaoyao (Fiona) Zhao, Robert Brown, Thomas R. Kramer, Xun Xu
    Pages 209-252
  8. Yaoyao (Fiona) Zhao, Robert Brown, Thomas R. Kramer, Xun Xu
    Pages 253-273
  9. Yaoyao (Fiona) Zhao, Robert Brown, Thomas R. Kramer, Xun Xu
    Pages 275-307
  10. Yaoyao (Fiona) Zhao, Robert Brown, Thomas R. Kramer, Xun Xu
    Pages 309-324
  11. Back Matter
    Pages 325-367

About this book

Introduction

Dimensional metrology is an essential part of modern manufacturing technologies, but the basic theories and measurement methods are no longer sufficient for today's digitized systems. The information exchange between the software components of a dimensional metrology system not only costs a great deal of money, but also causes the entire system to lose data integrity.

Information Modeling for Interoperable Dimensional Metrology analyzes interoperability issues in dimensional metrology systems and describes information modeling techniques. It discusses new approaches and data models for solving interoperability problems, as well as introducing process activities, existing and emerging data models, and the key technologies of dimensional metrology systems.

Written for researchers in industry and academia, as well as advanced undergraduate and postgraduate students, this book gives both an overview and an in-depth understanding of complete dimensional metrology systems. By covering in detail the theory and main content, techniques, and methods used in dimensional metrology systems, Information Modeling for Interoperable Dimensional Metrology enables readers to solve real-world dimensional measurement problems in modern dimensional metrology practices. 

Keywords

Data Model Dimensional Analysis Dimensional Metrology Information Interfaces Information Modelling Metrology Systems

Authors and affiliations

  • Yaoyao (Fiona) Zhao
    • 1
  • Robert Brown
    • 2
  • Thomas R. Kramer
    • 3
  • Xun Xu
    • 4
  1. 1.National Institute of Standards and TechGaithersburgUSA
  2. 2.Mitutoyo America CorporationAuroraUSA
  3. 3.National Institute of Standards and TechGaithersburgUSA
  4. 4., Department of Mechanical EngineeringUniversity of AucklandAucklandNew Zealand

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4471-2167-1
  • Copyright Information Springer-Verlag London Limited 2011
  • Publisher Name Springer, London
  • eBook Packages Engineering
  • Print ISBN 978-1-4471-2166-4
  • Online ISBN 978-1-4471-2167-1
  • About this book